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Guangjun Cheng is a guest researcher in the Physical Measurement Laboratory at the National Institute of Standards and Technology (NIST). He is working in the Nanoelectronics Group with Angela Hight Walker to synthesize nanoscale materials, including nanoparticles, nanotubes, and nanowires, and to characterize their properties using transmission electron microscopy (TEM), scanning electron microscopy (SEM), atomic force microscopy (AFM), x-ray diffraction (XRD), superconducting quantum interference device (SQUID), Raman spectroscopy, synchrotron x-ray (EXAFS and XANE), and neutron scattering.
• Magnetic nanoparticles
• Colloidal copper nanoparticles and their chemical reactivity
• Chemically modified graphene
Semiconductor and Dimensional Metrology Division
2003-present, NIST, Gaithersburg, MD
Ph.D. Chemistry, University of California, Davis, Davis, CA
M.S. Peking University, Beijing, China
B.S. Northeast Normal University, Changchun, China