Dr. McGray is a contractor in the Nanoscale Metrology Group in the Semiconductor & Dimensional Metrology Division of the Physical Measurement Laboratory (PML) at the National Institute of Standards and Technology (NIST). He serves as an expert on micro-electromechanical systems (MEMS) and fabrication of micro- and nano-scale structures. He founded and leads NIST's microrobotics competition series, and works on the development of standards and measurements for existing and emerging components of the "Small Tech" industry. He received his Ph.D. from Dartmouth in 2005.
Semiconductor & Dimensional Metrology Division
Nanoscale Metrology Group
Ph.D. from Dartmouth, 2005.