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Dr. Vincent D. Lee

Dr. Lee is a guest researcher in the Dimensional Metrology Group (683.01) in the Semiconductor & Dimensional Metrology Division (683) of the Physical Measurement Laboratory (PML) at the National Institute of Standards and Technology (NIST).

Position:

Guest Researcher
Semiconductor & Dimensional Metrology Division
Dimensional Metrology Group
Contact

Phone: 301-975-4683
Email: vincent.d.lee@nist.gov
Fax: 301-975-5360