Frontiers of Characterization and Metrology for Nanoelectronics

The 2013 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (formerly titled Characterization and Metrology for ULSI Technology) will be held March 25-28, 2013 at the National Institute of Standards and Technology (NIST), Gaithersburg, Maryland, USA. This conference, the ninth in the series, will focus on the frontiers and innovation in characterization and metrology of nanoelectronics.

The conference is sponsored by the National Institute of Standards and Technology, College of Nanoscale Science and Engineering, CEA-LETI, Semiconductor Research Corporation (SRC), International SEMATECH Manufacturing Initiative (ISMI), AVS, National Science Foundation (NSF), American Physical Society (APS), and IEEE/Electron Devices Society

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Author Instructions

• Abstract Template

Related Links:

• View slides from the invited presentations of the 2011 conference 
• Download the full 2011 conference program
• Archived Talks and Publications
• Past Conferences

Committee Co-Chairs:

• David Seiler, NIST
• Alain Diebold, College of Nanoscale Science and Engineering, SUNY Albany
• Bob McDonald, formerly of Intel (Treasurer)
• George Thompson, Intel
• Amal Chabli, LETI

Committee Co-Chairs:

• Luigi Colombo, TI
  
• Michael Current, Current Scientific
• Bob Havemann, SRC
• Dick Hockett, Evans Analytical Group Ltd
• Toshihiko Kanayama, AIST
• David Kyser, Applied Materials
• Shifeng Lu, Micron
• Zhiyong Ma, Intel
• Ulrich Mantz, Zeiss
• Lori S. Nye, Brewer Science, Inc.
• Yaw Obeng, NIST
• Erik Secula, NIST
• Sandip Tiwari, Cornell University
• Victor Vartanian, ISMI
• Wilfried Vandervorst, IMEC
• Usha Varshney, NSF
• Ehrenfried Zschech, Fraunhofer Institute for Non-Destructive Testing
  

"There were a total of 34 talks and 81 poster presentations that summarized major issues and provided critical reviews of crucial semiconductor developments and techniques needed as the industry evolves to silicon nanoelectronics and beyond."    

- Alex Braun, "A Jaunt Through Nanotechnopolis,"
Semiconductor International, May 20, 2009

"If you want to meet, greet, and learn from the world's experts in metrology, this is the place to be."    

- Dan Hutcheson, The Chip Insider,
January 11, 2007