The location and dates for the 2015 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics will be announced here soon!
The 2013 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (formerly titled Characterization and Metrology for ULSI Technology) was held March 25-28, 2013 at the National Institute of Standards and Technology (NIST), Gaithersburg, Maryland, USA. This conference, the ninth in the series, focused on the frontiers and innovation in characterization and metrology of nanoelectronics.
The conference was sponsored by the National Institute of Standards and Technology, College of Nanoscale Science and Engineering, CEA-LETI, Semiconductor Research Corporation (SRC), International SEMATECH Manufacturing Initiative (ISMI), AVS, National Science Foundation (NSF), American Physical Society (APS), and IEEE/Electron Devices Society
We were pleased to have Mike Mayberry, VP and Director of Component Research, Intel; Naga Chandrasekaran, VP of Process R&D, Micron; and Gyeong-Su Park, Leader of Analytical Science Group, Samsung Advanced Institute of Technology, as keynote speakers for the event. Over 30 other invited talks offered overviews in the sessions that follow.
- Alex Braun, "A Jaunt Through Nanotechnopolis,"
"If you want to meet, greet, and learn from the world's experts in metrology, this is the place to be."
- Dan Hutcheson, The Chip Insider,
Start Date: Monday, March 25, 2013
End Date: Thursday, March 28, 2013
Location: NIST, Gaithersburg, MD, USA - Administration Building, Green Auditorium
Audience: Industry, Government, Academia
The registration fee for the conference includes coffee breaks, lunches, a reception, a banquet, a barbecue, and an extended abstract booklet with CD-ROM. The Early Bird registration fee is $450. Students may register for $250. Early Bird registration ends on Feb. 15, 2013! After Feb. 15th, the registration fee will be $550.
Registration is now closed for this event.