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Frontiers of Characterization and Metrology for Nanoelectronics


The 2017 International Conference on Frontiers of Characterization and Metrology for Nanoelectronics (FCMN) will be held at the Monterey Marriott in Monterey, CA, Mar. 21-23, 2017.


Monterey is a scenic California coastal city that rises from the pristine Monterey Bay to pine forested hillsides with sweeping bay views.

The Conference:

The FCMN will bring together scientists and engineers interested in all aspects of the characterization technology needed for nanoelectronic materials and device research, development, and manufacturing. All approaches are welcome: chemical, physical, electrical, magnetic, optical, in-situ, and real-time control and monitoring. The conference will summarize major issues and provided critical reviews of important semiconductor techniques needed as the semiconductor industry moves to silicon nanoelectronics and beyond.

The conference consists of formal invited presentation sessions and poster sessions for contributed papers. The poster papers cover new developments in characterization and metrology especially at the nanoscale.

The conference series began 1995 and is the 11th conference in the series.

Additional details will be available soon!


Start Date: Tuesday, March 21, 2017
End Date: Thursday, March 23, 2017
Location: Monterey Marriott, Monterey, CA
Audience: Industry, Government, Academia
Format: Conference