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Patent and Published Patent Application Database

Search by Patent or Published Patent Application Title, Abstract, Body, Technology Type, and NIST Inventors

The United States Patent and Trademark Office defines a patent as, “…a property right granted by the Government of the United States of America to an inventor to exclude others from making, using, offering for sale, or selling the invention throughout the United States…”.

NIST has licensed numerous technologies for multiple industry sectors (e.g., healthcare, homeland security and cybersecurity) and seeks government, industry, and academia to partner and license NIST technologies. Visit the NIST Technology Partnerships Office section to explore the most effective partnering models and technology transfer mechanisms for your organization.

Take a moment now and explore NIST patents and published patent applications and envision what could take your enterprise to the next level. The TPO/NIST Patent and Published Patent Application Database provides access to technologies starting from FY 2018-present. To view all of NIST's patents and published patent applications, visit the NIST pages on the Federal Laboratory Consortium website.

Recent Patents

Picture of the Ice Maker with the words "Ice Maker" displayed above it

Icemaker, Process for Controlling Same and Making Ice

NIST Inventors
David A. Yashar
A system to make ice includes a refrigeration unit and an icemaker disposed in the refrigeration unit. The refrigeration unit is configured to be subjected to a refrigeration cycle; the icemaker is configured to be subjected to a freeze cycle; and the system is configured such that the freeze cycle
Image of 2 security officers inspecting packages

Authentication Article and Process for Making Same

NIST Inventors
Yaw S. Obeng and Joseph J. Kopanski
An authentication article includes: a substrate including: a first surface; a second surface disposed laterally to the first surface and at a depth below the first surface; and a plurality of indentations including the depth at the second surface of the substrate; and an array disposed on the
A photo of the noncntact dielectric and conductivity meter for high-throughput processing and a circuit diagram of the circuit used to track the resonant frequency and quality factor of the microwave resonator.

Noncontact Resonameter, Process for making and use of same

NIST Inventors
Jan Obrzut , Nate Orloff and Chris Long
A noncontact resonameter includes: a resonator to: produce an excitation signal including a field; subject a sample to the excitation signal; produce a first resonator signal in a presence of the sample and the excitation signal, the first resonator signal including: a first quality factor of the
Image of diagrams for the Classic Mach - Zehnder interferometer, Microwae transmission line based vserion, and guided wave probe tip interacts with sample

Phase Shift Detector Process for Making and Use of Same

NIST Inventors
Kin (Charles) Cheung , Jason Ryan and Jason Campbell
The detector senses very small phase shifts in a highly balanced microwave bridge. An electric field optimized microwave probe, in close proximity to a sample, serves to perturb the degree of bridge balance due to a .change in effective dielectric constant of the sample. The major innovation
Image of a spreadhsheet with some records

Next Generation Access Control System and Process for Controlling Database Access

NIST Inventors
Joshua Roberts , Gopi Katwala and David Ferraiolo
A computer-implemented method included: receiving, by an access manager, a query from a source; communicating the query from the access manager to a translator; translating the query into a next generation access control (NGAC) input; communicating the NGAC input to an NGAC engine, the NGAC engine
Image of an map view with the text "Natural gas extraction east of Platteville Colorado. DCS could monitor over 100 sites from central location. Overlapping fields could ensure complete coverage".

Hub and Spoke System for Detecting and Locating Gas Leaks

NIST Inventors
Greg Rieker , Ian Coddington , Kuldeep Prasad and Anna Karion
A system for detecting gas leaks and determining their location and size. A data gathering portion of the system utilizes a hub and spoke configuration to collect path-integrated spectroscopic data over multiple open paths around an area. A processing portion of the system applies a high-resolution
Image of devices on a table

Optical Parametric Oscillator

NIST Inventors
John T. Woodward IV
An optical parametric oscillator produces optical parametric light and includes a frequency splitter to produce signal light and idler light; a wavelength selector to select a wavelength of the signal light and to produce optical parametric light from the selected wavelength of the signal light; and