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Optical Microscopy Information at NIST

  • Aaron Cordes

  • Better Chemistry Through Nanorings

  • Calibrated Atomic Force Microscopy

  • CNST Releases the Fall 2013 Edition of The CNST News

  • CNST Releases the Spring 2012 Edition of The CNST News

  • CNST Releases the Summer 2012 Edition of The CNST News

  • Combining Centuries-Old Mathematical Theorems Provides an Efficient Approach for Characterizing the Shape of Nanoparticles

  • Cynthia Zeissler

  • Dr. Al M. Hilton

  • Dr. Egon Marx

  • Dr. Hui Zhou

  • Dr. Jing Qin

  • Dr. Lingfeng Chen

  • Dr. Ronald G. Dixson

  • Dr. Theodore V. Vorburger

  • Dr. Vladimir A. Ukraintsev

  • Electromagnetic Scattering

  • Fluctuations and Nanoscale Control

  • Fluctuations and Nanoscale Control Software

  • Francois R. Goasmat

  • Frank W. Gayle

  • John Bonevich

  • Jonathan Lefman

  • Joseph (Joe) Fu

  • Jun-Feng (John) Song

  • Li Ma

  • Marcelo Davanco

  • Mark-Alexander Henn

  • Metrology Electron Microscopy

  • Microform Metrology

  • Modeling and Simulation of Nanofabrication

  • Ndubuisi George Orji

  • New Quantum Dot Technique Combines Best of Optical and Electron Microscopy

  • NIST Center for Nanoscale Science and Technology Researchers Introduce Blind Students to Nanoscale Science

  • NIST Nanoscale Dimensioning Technique Wins R&D 100 Award

  • Real-Time Tracking and Fluorescence Spectroscopy of Individual Nanoparticles

  • Researchers Determine Critical Factors for Improving Performance of a Solar Fuel Catalyst

  • Researchers Determine the Optimum Path for Tracking Fluorescent Nanoparticles Using a Laser

  • Selected Publications on Dimensional Metrology - 20-Degree Celsius Paper

  • Selected Publications on Dimensional Metrology - Gage Blocks

  • Selected Publications on Dimensional Metrology - Measurement Assurance

  • Selected Publications on Dimensional Metrology - Other Calibrations

  • Selected Publications on Dimensional Metrology - Uncertainty and Statistics

  • Son H. Bui

  • Staff Directory

  • Standard Bullets and Casings

  • Stephan Stranick

  • Superresolving Optical Microscopy

  • Surface and Nanostructure Metrology Group

  • Surface Finish Metrology

  • Thomas Brian Renegar

  • Wei Chu

  • Xiaoyu Alan Zheng