The Journal of Research of NIST reports NIST research and development in metrology and related fields of: physical science, engineering, applied mathematics, statistics, biotechnology, information technology.
For additional information see: About the Journal
Volume 114 |
ISSN: 1044-677X |
Issue 1 |
Issue 2 |
Issue 3 |
Issue 4 |
Issue 5 |
Issue 6 |
Synthesis of Polymerizable Cyclodextrin Derivatives for Use in Adhesion-Promoting Monomer Formulations, p. 1
http://dx.doi.org/10.6028/jres.114.001
Adhesive Bonding to Dentin Improved by Polymerizable Cyclodextrin Derivatives, p. 11
http://dx.doi.org/10.6028/jres.114.002
ASME B89.4.19 Performance Evaluation Tests and Geometric Misalignments in Laser Trackers, p. 21
http://dx.doi.org/10.6028/jres.114.003
Statistical Analysis of a Round-Robin Measurement Survey of Two Candidate Materials for a Seebeck Coefficient Standard Reference Material, p. 37
http://dx.doi.org/10.6028/jres.114.004
Implementation of Two-Dimensional Polycrystalline Grains in Object Oriented Micromagnetic Framework, p. 57
http://dx.doi.org/10.6028/jres.114.005
Measurement of Absorption and Scattering With an Integrating Sphere Detector: Application to Microalgae, p. 69
http://dx.doi.org/10.6028/jres.114.006
Issues in Optical Diffraction Theory, p. 83
http://dx.doi.org/10.6028/jres.114.007
Priorities for Standards and Measurements to Accelerate Innovations in Nano-Electrotechnologies: Analysis of the NIST-Energetics-IEC TC 113 Survey, p. 99
http://dx.doi.org/10.6028/jres.114.008
Calibration of Speed Enforcement Down-The-Road Radars, p. 137
http://dx.doi.org/10.6028/jres.114.009
High Speed Quantum Key Distribution Over Optical Fiber Network System, p. 149
http://dx.doi.org/10.6028/jres.114.010
Method for the Characterization of Extreme-Ultraviolet Photoresist Outgassing, p. 179
http://dx.doi.org/10.6028/jres.114.011
The Detection of Lyman Alpha Radiation Formed by the Slowing Down of Protons and Tritons Produced by the 3He (n,tp) Reaction—A Model Study, p. 185
http://dx.doi.org/10.6028/jres.114.012
Pass-Fail Testing: Statistical Requirements and Interpretations, p. 195
http://dx.doi.org/10.6028/jres.114.013
Characterization of Probe Dynamic Behaviors in Critical Dimension Atomic Force Microscopy, p. 201
http://dx.doi.org/10.6028/jres.114.014
Procedures for Wavelength Calibration and Spectral Response Correction of CCD Array Spectrometers, p. 215
http://dx.doi.org/10.6028/jres.114.015
Design of the DEMO Fusion Reactor Following ITER, p. 229
http://dx.doi.org/10.6028/jres.114.016
A Method for Assigning Priorities to United States Measurement System (USMS) Needs: Nano-Electrotechnologies, p. 237
http://dx.doi.org/10.6028/jres.114.017
First-Principles Calculation of the Third Virial Coefficient of Helium, p. 249
http://dx.doi.org/10.6028/jres.114.018
Perturbations From Ducts on the Modes of Acoustic Thermometers, p. 263
http://dx.doi.org/10.6028/jres.114.019
Uncertainty Calculation for Spectral-Responsivity Measurements, p. 287
http://dx.doi.org/10.6028/jres.114.020
Calcium Fluoride Precipitation and Deposition From 12 mmol/L Fluoride Solutions With Different Calcium Addition Rates, p. 293
http://dx.doi.org/10.6028/jres.114.021
New Spherical Gamma-Ray and Neutron Emitting Sources for Testing of Radiation Detection Instruments, p. 303
http://dx.doi.org/10.6028/jres.114.022
Comparison of the NIST and PTB Air-Kerma Standards for Low-Energy X-Rays, p. 321
http://dx.doi.org/10.6028/jres.114.023
Elastic-Stiffness Coefficients of Titanium Diboride, p. 333
http://dx.doi.org/10.6028/jres.114.024
DAVE: A Comprehensive Software Suite for the Reduction, Visualization, and Analysis of Low Energy Neutron Spectroscopic Data, p. 341
http://dx.doi.org/10.6028/jres.114.025

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