Journal of Research of NIST

The Journal of Research of NIST reports NIST research and development in metrology and related fields of: physical science, engineering, applied mathematics, statistics, biotechnology, information technology.

For additional information see: About the Journal

Volume 109

 ISSN: 1044-677X

Issue 1

Issue 2

Issue 3

Issue 4

Issue 5

Issue 6


Issue 1 January-February 2004

 

Accuracy in powder diffraction III - Part 1 - Preface, and Front Matter, p. iii
Cline, James P. (editor)
http://dx.doi.org/10.6028/jres.109.001

Fundamental Parameters Line Profile Fitting in Laboratory Diffractometers, p. 1
R. W. Cheary, A. A. Coelho, and J. P. Cline
http://dx.doi.org/10.6028/jres.109.002

Polycapillary Optics for Materials Science Studies: Instrumental Effects and Their Correction, p. 27
M. Leoni, U. Welzel, and P. Scardi
http://dx.doi.org/10.6028/jres.109.003

Direct Space Structure Solutions Applications, p. 49
Maryjane Tremayne
http://dx.doi.org/10.6028/jres.109.004

Diffraction Line Broadening Analysis if Broadening Is Caused by Both Dislocations and Limited Crystallite Size, p. 65
J.-D. Kamminga and L. J. Seijbel
http://dx.doi.org/10.6028/jres.109.005

X-Ray Spectrometry of Copper: New Results on an Old Subject, p. 75
M. Deutsch, E. Förster, G. Hölzer, J. Härtwig, K. Hämäläinen, C.-C. Kao, D. Huotari, and R. Diamant
http://dx.doi.org/10.6028/jres.109.006

Multidataset Refinement Resonant Diffraction, and Magnetic Structures, p. 99
J. Paul Attfield
http://dx.doi.org/10.6028/jres.109.007

Powder Diffraction: Least-Squares and Beyond, p. 107
W. I. F. David
http://dx.doi.org/10.6028/jres.109.008

Direct Methods Optimised for Solving Crystal Structure by Powder Diffraction Data: Limits, Strategies, and Prospects, p. 125
Angela Altomare, Carmelo Giacovazzo, Anna Grazia Giuseppina Moliterni, and Rosanna Rizzi
http://dx.doi.org/10.6028/jres.109.009

The High Resolution Powder Diffraction Beam Line at ESRF, p. 133
A. N. Fitch
http://dx.doi.org/10.6028/jres.109.010

Global Rietveld Refinement, p. 143
Kenneth Shankland
http://dx.doi.org/10.6028/jres.109.011

Bayesian Inference of Nanoparticle-Broadened X-Ray Line Profiles, p. 155
Nicholas Armstrong, Walter Kalceff, James P. Cline, and John Bonevich
http://dx.doi.org/10.6028/jres.109.012

Issue 2 March-April 2004

 

The Remarkable Metrological History of Radiocarbon Dating [II], p. 185
L. A. Currie
http://dx.doi.org/10.6028/jres.109.013

Characterization of Combinatorial Polymer Blend Composition Gradients by FTIR Microspectroscopy, p. 219
Naomi Eidelman and Carl G. Simon, Jr.
http://dx.doi.org/10.6028/jres.109.014

Spot Weld Analysis With 2D Ultrasonic Arrays, p. 233
A. A. Denisov, C. M. Shakarji, B. B. Lawford, R. Gr. Maev, and J. M. Paille
http://dx.doi.org/10.6028/jres.109.015

Standard Reference Materials (SRMs) for the Calibration and Validation of Analytical Methods for PCBs (as Aroclor Mixtures), p. 245
Dianne L. Poster, Michele M. Schantz, Stefan D. Leigh, and Stephen A. Wise
http://dx.doi.org/10.6028/jres.109.016

Simulation of Sheared Suspenions With a Parallel Implementation of QDPD, p. 267
James S. Sims and Nicos Martys
http://dx.doi.org/10.6028/jres.109.017

Software Architecture for a Virtual Environment for Nano Scale Assembly (VENSA), p. 279
Yong-Gu Lee, Kevin W. Lyons, and Shaw C. Feng
http://dx.doi.org/10.6028/jres.109.018

Intramural Comparison of NIST Laser and Optical Fiber Power Calibrations, p. 291
John H. Lehman, Igor Vayshenker, David J. Livigni, and Joshua Hadler
http://dx.doi.org/10.6028/jres.109.019

Erratum: Statistical Interpretation of Key Comparison Reference Value and Degrees of Equivalence, p. 299
R. N. Kacker, R. U. Datla, and A. C. Parr
http://dx.doi.org/10.6028/jres.109.020

Erratum: New National Air-Kerma-Strength Standards for 125I and 103Pd Brachytherapy Seeds, p. 301
Stephen M. Seltzer, Paul J. Lamperti, Robert Loevinger, Michael G. Mitch, James T. Weaver, and Bert M. Coursey
http://dx.doi.org/10.6028/jres.109.021

Erratum: Determining the Magnetic Properties of 1 kg Mass Standards, p. 303
Richard S. Davis
http://dx.doi.org/10.6028/jres.109.022

Issue 3 May-June 2004

 

Front Cover–Title Page–Contents

Uncertainty Propagation for NIST Visible Spectral Standards, p. 305
James L. Gardner
http://dx.doi.org/10.6028/jres.109.023

Uncertainties in Small-Angle Measurement Systems Used to Calibrate Angle Artifacts, p. 319
Jack A. Stone, Mohamed Amer, Bryon Faust, and Jay Zimmerman
http://dx.doi.org/10.6028/jres.109.024

Embedded MicroHeating Elements in Polymeric MicroChannels for Temperature Control and Fluid Flow Sensing, p. 335
Michael Gaitan and Laurie E. Locascio
http://dx.doi.org/10.6028/jres.109.025

Uncertainty and Traceability for the CEESI Iowa Natural Gas Facility, p. 345
Aaron Johnson and Tom Kegel
http://dx.doi.org/10.6028/jres.109.026

High-Resolution Observations of the Infrared Spectrum of Neutral Neon, p. 371
Craig J. Sansonetti, Marion M. Blackwell, and E. B. Saloman
http://dx.doi.org/10.6028/jres.109.027

Issue 4 July-August 2004

 

Front Cover–Title Page–Contents

Initial NIST AC QHR Measurements, p. 391
M. E. Cage, S. H. Shields, and A. Jeffery
http://dx.doi.org/10.6028/jres.109.028

Frequency-Domain Models for Nonlinear Microwave Devices Based on Large-Signal Measurements, p. 407
Jeffrey A. Jargon, Donald C. DeGroot, and K. C. Gupta
http://dx.doi.org/10.6028/jres.109.029

Nonlinearity Measurements of High-Power Laser Detectors at NIST, p. 429
Hiaoyu Li, Thomas Scott, Shao Yang, Chris Caromer, and Marla Dowell
http://dx.doi.org/10.6028/jres.109.030

Two Primary Standards for Low Flows of Gases, p. 435
Robert F. Berg and Stuart A. Tison
http://dx.doi.org/10.6028/jres.109.031

Evaluation of Handheld Radionuclide Identifiers, p. 451
L. Pibida, M. Unterweger, and L. R. Karam
http://dx.doi.org/10.6028/jres.109.032

Issue 5 September-October 2004

 

Front Cover–Title Page–Contents

Optical Diffraction in Close Proximity to Plane Apertures. III. Modified, Self-Consistent Theory, p. 457
Klaus D. Mielenz
http://dx.doi.org/10.6028/jres.109.033

Development of A High Throughput Method Incorporating Traditional Analytical Devices, p. 465
C. C. White, E. Embree, W. E. Byrd, and A. R. Patel
http://dx.doi.org/10.6028/jres.109.034

Determining the Uncertainty of X-Ray Absorption Measurements, p. 479
Gary S. Wojcik
http://dx.doi.org/10.6028/jres.109.035

Analytical Representations of Elastic Moduli Data With Simultaneous Dependence on Temperature and Porosity, p. 497
R. G. Munro
http://dx.doi.org/10.6028/jres.109.036

Electron-Impact Cross Sections for Ground State to np Excitations of Sodium and Potassium, p. 505
Philip M. Stone and Yong-Ki Kim
http://dx.doi.org/10.6028/jres.109.037

Stability Comparison of Recordable Optical Discs--A Study of Error Rates in Harsh Conditions, p. 517
Oliver Slattery, Richang Lu, Jian Zheng, Fred Byers, and Xiao Tang
http://dx.doi.org/10.6028/jres.109.038

Issue 6 November-December 2004

 

Front Cover–Title Page–Contents.

A Small-Volume Apparatus for the Measurement of Phase Equilibria, p. 525
Stephanie L. Outcalt and Byung-Chul Lee
http://dx.doi.org/10.6028/jres.109.039

SRM 2460/2461 Standard Bullets and Casings Project, p. 533
J. Song, E. Whitenton, D. Kelley, R. Clary, L. Ma, S. Ballou, and M. Ols
http://dx.doi.org/10.6028/jres.109.040

Properties of Nanostructured Hydroxyapatite Prepared by a Spray Drying Technique, p. 543
Laurence C. Chow, Limin Sun, and Bernard Hockey
http://dx.doi.org/10.6028/jres.109.041

Preparation and Comprehensive Characterization of a Calcium Hydroxyapatite Reference Material, p. 553
Milenko Markovic, Bruce O. Fowler, and Ming S. Tung
http://dx.doi.org/10.6028/jres.109.042

Ambiguities in Powder Indexing: Conjunction of a Ternary and Binary Lattice Metric Singularity in the Cubic System, p. 569
Alan D. Mighell
http://dx.doi.org/10.6028/jres.109.043


Subject Index to Volume 109, p. 581

Author Index to Volume 109, p. 585

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