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Journal of Research of NIST

The Journal of Research of NIST reports NIST research and development in metrology and related fields of: physical science, engineering, applied mathematics, statistics, biotechnology, information technology.

For additional information see: About the Journal

Volume 101

 ISSN: 1044-677X

Issue 1

Issue 2

Issue 3

Issue 4

Issue 5

Issue 6




Issue 1 January-February 1996

 

An International Marine-Atmospheric 222-Rn Measurement Intercomparison in Bermuda Part I: NIST Calibration and Methodology for Standardized Sample Additions, p. 1
R. Colle, M. P. Unterweger, P. A. Hodge, and J. M. R. Hutchinson
http://dx.doi.org/10.6028/jres.101.005

An International Marine-Atmospheric 222-Rn Measurement Intercomparison in Bermuda Part II: Results for the Participating Laboratories, p. 21
R. Colle, M. P. Unterweger, J. M. R. Hutchinson, S. Whittlestone, Georges Polian, Benedicte Ardouin, Jack G. Kay, James P. Friend, Byron W. Blomquist, Wolfgang Nadler, Thomas T. Dang, R. J. Larsen, an A. R. Hutter
http://dx.doi.org/10.6028/jres.101.006

Theory of Electron Beam Moire, p. 47
David R. Read and James W. Dally
http://dx.doi.org/10.6028/jres.101.007

50th Calorimetry Conference- Conference Report, p. 63
Eugene S. Domalski, Robert N. Goldberg, and Patrick A. G. O'Hare
http://dx.doi.org/10.6028/jres.101.008

Second Workshop on Industrial Applications of Scanned Probe Microscopy, p. 69
John A. Dagata, Alain C. Diebold, C. K. Ken Shih, and Richard J. Colton
http://dx.doi.org/10.6028/jres.101.009

International Workshop on Instrumented Indentation, p. 77
Douglas T. Smith
http://dx.doi.org/10.6028/jres.101.010

Manufacturing Technology Conference: Toward a Common Agenda, p. 83
David C. Stieren
http://dx.doi.org/10.6028/jres.101.011

Workshop on Planning for Compound Semiconductor Technology, p. 89
Herbert S. Bennett
http://dx.doi.org/10.6028/jres.101.012

News Briefs, p. 95
http://dx.doi.org/10.6028/jres.101.013


Issue 2 March-April 1996

 

The NIST Detector-Based Luminous Intensity Scale, p. 109
C. L. Cromer, G. Eppeldauer, J. E. Hardis, T. C. Larason, Y. Ohno, and A. C. Parr
http://dx.doi.org/10.6028/jres.101.014

The NIST High Accuracy Scale for Absolute Spectral Response from 406 nm to 920 nm, p. 133
T. C. Larason, S. S. Bruce, and C. L. Cromer
http://dx.doi.org/10.6028/jres.101.015

Irradiance of Horizontal Quartz-Halogen Standard Lamps, p. 141
Edward A. Early and Ambler Thompson
http://dx.doi.org/10.6028/jres.101.016

Development of the Ion Exchange-Gravimetric Method for Sodium in Serum as a Definitive Method, p. 155
John R. Moody and Thomas W. Vetter
http://dx.doi.org/10.6028/jres.101.017

The MasPar MP-1 As a Computer Arithmetic Laboratory, p. 165
Michael A. Anuta, Daniel W. Lozier, and Peter R. Turner
http://dx.doi.org/10.6028/jres.101.018

Evidence That Voltage Rather Than Resistance is Quantized in Breakdown of the Quantum Hall Effect, p. 175
M. E. Cage
http://dx.doi.org/10.6028/jres.101.019

News Briefs, p. 181
http://dx.doi.org/10.6028/jres.101.020


Issue 3 May-June 1996

 

Front Cover–Title Page–Contents
http://dx.doi.org/10.6028/jres.101.001
CRYSTMET–The NRCC Metals Crystallographic Data File, p. 205
Gordon H. Wood, John R. Rodgers, S. Roger Gough, and Pierre Villars
http://dx.doi.org/10.6028/jres.101.021

Inorganic Crystal Structure Database (ICSD) and Standardized Data and Crystal Chemical Characterization of Inorganic Structure Types (TYPIX)–Two Tools for Inorganic Chemists and Crystallographers, p. 217
Ekkehard Fluck
http://dx.doi.org/10.6028/jres.101.022

Evaluation of Crystallographic Data with the Program DIAMOND, p. 221
Guenther Bergerhoff, Michael Berndt, and Klaus Brandenburg
http://dx.doi.org/10.6028/jres.101.023

The Cambridge Structural Database (CSD): Current Activities and Future Plans, p. 227
David G. Watson
http://dx.doi.org/10.6028/jres.101.024

The Protein Data Bank: Current Status and Future Challenges, p. 231
Enrique E. Abola, Nancy O. Manning, Jaime Prilusky, David R. Stampf, and Joel L. Sussman
http://dx.doi.org/10.6028/jres.101.025

The Nucleic Acid Database: Present and Future, p. 243
Helen M. Berman, Anke Gelbin, Lester Clowney, Shu-Hsin Hsieh, Christine Zardecki, and John Westbrook
http://dx.doi.org/10.6028/jres.101.026

The Powder Diffraction File: Past, Present, and Future, p. 259
Deane K. Smith and Ron Jenkins
http://dx.doi.org/10.6028/jres.101.027

NIST Crystallographic Databases for Research and Analysis, p. 273
Alan D. Mighell and Vicky Lynn Karen
http://dx.doi.org/10.6028/jres.101.028

Conventional and Eccentric Uses of Crystallographic Databases in Practical Materials Identification Problems, p. 281
James A. Kaduk
http://dx.doi.org/10.6028/jres.101.029

Using NIST Crystal Data Within Siemens Software for Four-Circle and SMART CCD Diffractometers, p. 295
Susan K. Byram, Charles F. Campana, James Fait, and Robert A. Sparks
http://dx.doi.org/10.6028/jres.101.030

Phase Identification in a Scanning Electron Microscope Using Backscattered Electron Kikuchi Patterns, p. 301
R. P. Goehner and J. R. Michael
http://dx.doi.org/10.6028/jres.101.031

The Biological Macromolecule Crystallization Database and NASA Protein Crystal Growth Archive, p. 309
Gary L. Gilliland, Michael Tung, and Jane Ladner
http://dx.doi.org/10.6028/jres.101.032

Investigations of the Systematics of Crystal Packing Using the Cambridge Structural Database, p. 321
Carolyn Pratt Brock
http://dx.doi.org/10.6028/jres.101.033

Troublesome Crystal Structures: Prevention, Detection, and Resolution, p. 327
Richard L. Harlow
http://dx.doi.org/10.6028/jres.101.034

CIF (Crystallographic Information File): A Standard for Crystallographic Data Interchange, p. 341
I. D. Brown
http://dx.doi.org/10.6028/jres.101.035

The Role of Journals in Maintaining Data Integrity: Checking of Crystal Structure Data in Acta Crystallograhpica, p. 347
Brian McMahon
http://dx.doi.org/10.6028/jres.101.036

Electronic Publishing and the Journals of the American Chemical Society, p. 357
Jeffrey D. Spring and Lorrin R. Garson
http://dx.doi.org/10.6028/jres.101.037

How the Cambridge Crystallographic Data Centre Obtains its Information, p. 361
David G. Watson
http://dx.doi.org/10.6028/jres.101.038

Data Import and Validation in the Inorganic Crystal Structure Database, p. 365
H. Behrens
http://dx.doi.org/10.6028/jres.101.039

World Wide Web for Crystallography, p. 375
H. D. Flack
http://dx.doi.org/10.6028/jres.101.040

Workshop Highlights, p. 381
Karen, V.L.; Mighell, A.
http://dx.doi.org/10.6028/jres.101.041

Workshop on Characterizing Diamond Films IV- Conference Report, p. 383
Albert Feldmann, Ajay P. Malshe, and John E. Graebner
http://dx.doi.org/10.6028/jres.101.042

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