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EVENTS

Industry Forum: Monitoring, Diagnostics, and Prognostics for Manufacturing Operations

forum

May 8 - 11, 2018

National Institute of Standards and Technology (NIST), 100 Bureau Drive, Gaithersburg, Md. 20899

Registration has closed.

If you are not registered, you will not be allowed on site. Registered attendees will receive security and campus instructions prior to the workshop.

NON U.S. CITIZENS PLEASE NOTE: All foreign national visitors who do not have permanent resident status and who wish to register for the above meeting must supply additional information. Failure to provide this information prior to arrival will result, at a minimum, in significant delays in entering the facility. Authority to gather this information is derived from United States Department of Commerce Department Administrative Order (DAO) number 207-12.

*New Visitor Access Requirement: Effective July 21, 2014, Under the REAL ID Act of 2005, agencies, including NIST, can only accept a state-issued driver’s license or identification card for access to federal facilities if issued by states that are REAL ID compliant or have an extension. As of Monday, January 30, 2017, Federal agencies will be prohibited from accepting driver’s licenses and identification cards from the following states for accessing federal facilities: Maine, Minnesota, Missouri, Montana and Washington. For further details, please visit our Campus Access and Security page.

Acceptable Photo Identification:
For Non-US Citizens: Valid passport for photo identification
For US Permanent Residents: Permanent Resident/Green card for photo identification

Registration Contact

Karen M. Startsman

karen.startsman@nist.gov

(301) 975-6602

Technical Contact

DOWNLOAD THE FINAL INDUSTRY FORUM CONFERENCE PROGRAM HERE and PRESENTATIONS ARE AVaiLABLE FOR DOWNLOAD IN THE TABLE AGENDA AT THE BOTTOM OF THIS PAGE.

The National Institute of Standards and Technology (NIST) is hosting an Industry Forum to bring Industry, Government, and Academia together to discuss the current trends, successes, challenges, and needs with respect to advanced monitoring, diagnostic, and prognostic technologies to enhance maintenance and control strategies within manufacturing operations. This event will bring together professionals to discuss the current and emerging capabilities and challenges with respect to designing, deploying, verifying, and validating monitoring, diagnostic, and prognostic technologies for manufacturing operations including those involving interconnected, Internet of Things (IoT) technologies. Click here to download this announcement.

Participants
Personnel expected to attend the overall forum include manufacturers from large and small to medium-sized enterprises, technology integrators, technology developers (both hardware and software), academia, standards development organizations, and government entities. Personnel interested in presenting and/or serving on a panel must submit an abstract for consideration. Presentations are not required for attendance, but are encouraged to drive discussion. Please see the Abstract Submission Guidance section for additional details. Download Submission Form here.

Attendee Benefits

Hearing the latest success stories from manufacturers who have reduced their equipment/process downtime, decreased their maintenance costs and defective part counts, increased their productivity and profits, maintained (or improved) their quality, and/or reaped other benefits and savings through implementing advanced monitoring, diagnostic, and prognostic technologies
Learning about the latest advances at the factory floor level in monitoring, diagnostics, and prognostics, including active research efforts at NIST and other organizations
Understanding how technological challenges were overcome to implement monitoring, diagnostic, and prognostic technologies
Networking with other industry professionals who have achieved similar successes, face comparable challenges, and/or can offer solutions
Providing critical input to an ASME committee focused on producing standards and/or guidelines to support monitoring, diagnostic, and prognostic technologies at the factory floor level

Agenda

The forum will feature a combination of keynote presentations, panel discussions, and interactive Q&A sessions with industry personnel focused on monitoring, diagnostic, and prognostic technologies. Sessions are expected to feature speakers from a wide-range of industries and backgrounds with some specific sessions dedicated to the large and small to medium-sized manufacturing communities, separately. The forum’s last day will present an opportunity for all attendees to contribute to an emerging standards effort, led by the American Society of Mechanical Engineers (ASME), that is aimed at producing guidelines to assist manufacturers with the design, implementation, and assessment of monitoring, diagnostic, and prognostic technologies within their own facilities. Industry participation and feedback is critical; the more input the community provides, the more relevant, broadly-applicable, and beneficial the output guidelines will be. The output guidelines are envisioned to increase productivity and efficiency, and decrease equipment/process downtime to ultimately lead to increased profits and decreased costs.

Agenda(PDF) Updated 4/27

PRESENTATIONS ARE AVAILABLE FOR DOWNLOAD IN THE TABLE AGENDA BELOW.

Download a Zip of all Industry Forum Presentations Here

AGENDA: Tuesday, May 8, 2018 (Green Auditorium)
TIME	EVENT/SESSION	PRESENTERS
7:15-4:30	Registration (outside the auditorium)
8:15-8:30	Introduction and Safety	Brian A. Weiss (NIST - Intelligent Systems Division), Michael Brundage (NIST - Systems Integration Division)
8:30-8:45	Welcome Address	Kirk Dohne (NIST - Engineering Laboratory)
8:45-9:20	PLENARY: Manufacturing USA	Michael Molnar (NIST - Office of Advanced Manufacturing)
9:20-9:35	BREAK
9:35 - 11:25	Large Manufacturing Needs and Case Studies - Presentations & Panel	Al Salour (Boeing), Luis Hernandez (Global Strategic Solutions), James Moyne (Applied Global Services)
11:25-12:40	LUNCH
12:40 - 2:30	Small to Medium Manufacturing Needs and Case Studies - Presentations & Panel	Scott Sipe (Mantec), Tom Zbell (Genedge), Thorsten Wuest (West Virginia University), Mark Walker (D2K)
2:30 - 2:45	BREAK
2:45 - 4:35	Communication and Information Flow to support PHM - Presentations & Panel	Will Sobel (Vimana), Moneer Helu (NIST - Systems Integration Division), Joel Neidig (ITAMCO), Rob Andes (The Knowledge Design Company)
4:35 - 4:55	The Costs and Benefits of Advanced Maintenance in Manufacturing	Doug Thomas (NIST - Applied Economics Office)
4:55 - 5:00	Closing and Departure	Brian A. Weiss (NIST - Intelligent Systems Division)

AGENDA: Wednesday, May 9, 2018 (Green Auditorium)
TIME	EVENT/SESSION	PRESENTERS
7:00-4:30	Registration (outside the auditorium)
8:00-8:05	Welcome	Brian A. Weiss (NIST - Intelligent Systems Division), Michael Brundage (NIST - Systems Integration Division)
8:05 - 8:35	PLENARY: NIST's Smart Manufacturing Programs	Al Wavering (NIST - Intelligent Systems Division)
8:35 - 10:35	Emerging Sensing Technologies to Enable Monitoring, Diagnostics, and Prognostics - Presentations & Panel	Radu Pavel (TechSolve), Brittany Newell (Purdue University), Justinian Rosca (Siemens Corporation), Gregory Vogl (NIST - Intelligent Systems Division), Ed Spence (Machine Instrumentation)
10:35 - 10:50	BREAK
10:50 - 12:50	Planning and Assessment to Promote Monitoring, Diagnostic, and Prognostic Technologies - Presentations & Panel	Karl Reichard (Penn State University Applied Research Lab), Ananth Seshan (MESA), Kai Goebel (NASA), Miguel Saez (University of Michigan), Jorge Arinez (General Motors)
12:50 - 1:50	LUNCH
1:50 - 3:20	Monitoring and Analysis Technologies for Prognostics and Health Management (PHM) - Presentations	David Siegel (Predictronics), Nancy Diaz-Elsayed (University of South Florida), Sanket Amberkar (Falkonry), Robert Gao (Case Western Reserve University), ChaBum Lee (Tennessee Tech University)
3:20 - 3:35	BREAK
3:35 - 4:05	Monitoring and Analysis Technologies for Prognostics and Health Management (PHM) - Panel	David Siegel (Predictronics), Nancy Diaz-Elsayed (University of South Florida), Sanket Amberkar (Falkonry), Robert Gao (Case Western Reserve University), ChaBum Lee (Tennessee Tech University)
4:05 - 4:25	Emerging Research Efforts	Junmin Lee (Seoul National University), Chan Hee Park (Seoul National University)
4:25 - 4:45	Using Unstructured Work Order Data to Improve Maintenance Procedures in Manufacturing	Michael Brundage (NIST - Systems Integration Division)
4:45 - 5:05	NIST Research on PHM of Manufacturing Workcells	Brian A. Weiss (NIST - Intelligent Systems Division)
5:05 - 5:10	Closing, and Departure	Brian A. Weiss (NIST - Intelligent Systems Division), Michael Brundage (NIST - Systems Integration Division)

AGENDA: Thursday, May 10, 2018 (Green Auditorium)
TIME	EVENT/SESSION	PRESENTERS
7:30-4:30	Registration (outside the auditorium)
8:30 - 8:35	Welcome Address	Brian A. Weiss (NIST - Intelligent Systems Division), Michael Brundage (NIST - Systems Integration Division)
8:35 - 9:05	PLENARY: Process Monitoring & Diagnosis	Jaime Camellio (Commonwealth Center for Advanced Manufacturing)
9:05 - 10:17	Standards and Best Practices - Presentations	Andrew Hess (Hess PHM Group), Ravi Rajamani (drR2), Tom Fiske (Yokogawa), Tom Hedberg (NIST - Systems Integration Division)
10:17 - 10:30	BREAK
10:30 - 10:50	Standards and Best Practices - Presentations Cont.	Logen Johnson (SAE), Donnie Alonzo (ASME)
10:50 - 11:50	Standards and Best Practices - Panel	Andrew Hess (Hess PHM Group), Ravi Rajamani (drR2), Tom Fiske (Yokogawa), Tom Hedberg (NIST - Systems Integration Division), Logen Johnson (SAE), Donnie Alonzo (ASME)
11:50 - 1:00	LUNCH
1:00 - 2:15	PHM within the International Manufacturing Community - Presentations	Byeng Youn (Seoul National University), Hyunbo Cho (Pohang University of Science and Technology), Hyunseok Oh (Gwangju Institute of Science and Technology)
2:15 - 3:15	Visualization Tools for PHM - Presentations & Panel	Jeremy Marvel (NIST - Intelligent Systems Division), Sinan Bank (Siemens Corporation)
3:15 - 3:30	BREAK
3:30 - 4:00	National Strategy on Artificial Intelligence and Opportunities for NIST	Michael Garris (NIST - Information Technology Laboratory)
4:00 - 4:30	Industry AI-- A System Perspective in Machine Learning for Smart Manufacturing and Maintenance	Jay Lee (University of Cincinnati, Center for Intelligent Maintenance Systems)
4:30 - 5:00	Planning for the Future - Building and Leveraging Artificial Intelligence: Panel Discussion	Jay Lee (University of Cincinnati, Center for Intelligent Maintenance Systems), Michael Garris (NIST - Information Technology Laboratory)
5:00 - 5:10	Closing and Departure	Brian A. Weiss (NIST - Intelligent Systems Division), Michael Brundage (NIST - Systems Integration Division)

AGENDA: Friday, May 11, 2018 (Green Auditorium)

ASME Standards Meeting - Monitoring, Diagnostics, and Prognostics for Manufacturing Operations

8:05 – 8:15 - Introduction to ASME’s Efforts in Monitoring, Diagnostics, and Prognostics (Brian Weiss / Michael Brundage)

Motivation for building up this standards community

Highlighted gaps from June and October 2017 Workshops

June 2017 Workshop Report - https://nvlpubs.nist.gov/nistpubs/ams/NIST.AMS.100-13.pdf

8:15 – 8:30 – Introduction to ASME (Donnie Alonzo/Steve Weinman)

8:30 – 9:00 – Presentation and collection of comments and feedback on Draft Charter for New Subcommittee (Brian Weiss)

9:10 – 10:00 – BRAINSTORMING #1 Discussion on Areas of Priority / Subcommittee Work Breakdown

This session will feature discussion on the top (6) priority areas that were identified in prior workshops and a determination which of these (6) areas should be discussed in greater detail in the BRAINSTORMING #2

Standardized Terminology for PHM Guideline on Data and Collection Strategies

Guideline to Determine What Health Data to Capture and Collection Strategies to Employ

Guideline to Determine What Sensors and Where they should be deployed to inform on Process/Equipment Health

Guideline for implementing sensor data fusion/multi-modal data fusion

Guideline to Determine When and Where PHM should be added/integrated

Expand MTConnect/Data Communications

10:00 – 10:15 – BREAK

10:15 – 12:30 – BRAINSTORMING #2 - Work Breakdown Structures and Project Team / Committee Structure

Groups will be formed and will be tasked to further detail a priority area (noted above). This effort will include definition/clarification of key deliverables, specific tasks, and an estimated timeline.

12:30 - 1:30 – LUNCH

1:30 – 2:15 – BRAINSTORMING #3 - Report Back, Interested Parties and Identification of potential Members / Finalizing of Committee Structure and Breakdown

2:15 – 2:30 – RECAP FROM ASME ON NEXT STEPS AND REQUIRED ITEMS FOR MEMBERSHIP (Donnie Alonzo/Steve Weinman)

2:30 – 2:45 – CLOSING AND DEPARTURE (Brian Weiss, Michael Brundage)

Hilton Gaithersburg
620 Perry Parkway, Gaithersburg, MD 20877

$119/night plus tax*

Book by April 22, 2018

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*Includes complimentary hotel shuttle to and from NIST

forum

May 8 - 11, 2018

National Institute of Standards and Technology (NIST), 100 Bureau Drive, Gaithersburg, Md. 20899

Registration has closed.

If you are not registered, you will not be allowed on site. Registered attendees will receive security and campus instructions prior to the workshop.

Acceptable Photo Identification:
For Non-US Citizens: Valid passport for photo identification
For US Permanent Residents: Permanent Resident/Green card for photo identification

Industry Forum: Monitoring, Diagnostics, and Prognostics for Manufacturing Operations

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