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Defect in Graphene May Present Bouquet of Possibilities
Release Date: 05/24/2011

Flower-like defects in graphene can occur during the fabrication process. The NIST team captured images of one of the defects (figures a and c) … more

NIST 'Nanowire' Measurements Could Improve Computer Memory
Release Date: 05/18/2011

In this schematic image (top) and transmission electron micrograph, a silicon nanowire is shown surrounded by a stack of thin layers of material … more

Good Eggs: NIST Nanomagnets Offer Food for Thought About Computer Memories
Release Date: 04/26/2011

Magnetics researchers at the National Institute of Standards and Technology (NIST) colored lots of eggs recently. Bunnies and children might find … more

Two Graphene Layers May Be Better Than One
Release Date: 04/26/2011

Researchers at the National Institute of Standards and Technology (NIST) have shown that the electronic properties of two layers of graphene vary … more

Understanding How Glasses 'Relax' Provides Some Relief for Manufacturers
Release Date: 04/26/2011

Researchers at the National Institute of Standards and Technology (NIST) and Wesleyan University have used computer simulations to gain basic … more

Getting the Point: Real-Time Monitoring of Atomic-Microscope Probes Adjusts for Wear
Release Date: 03/30/2011

Scientists at the National Institute of Standards and Technology (NIST) have developed a way to measure the wear and degradation of the … more

NIST’s Microscopic Drum Could Link Electromagnetic, Mechanical Motion at Quantum Level
Release Date: 03/15/2011

Physicists at the National Institute of Standards and Technology (NIST) have demonstrated an electromechanical circuit in which microwaves … more

NIST to Cosponsor Conference in France on Nanoelectronics Metrology
Release Date: 03/15/2011

Registration is now open for the eighth international Frontiers of Characterization and Metrology for Nanoelectronics conference, cosponsored by … more

NIST Electromechanical Circuit Sets Record Beating Microscopic 'Drum'
Release Date: 03/09/2011

Device May Help Process Information and Measure Motion at Quantum Scale BOULDER, Colo.—Physicists at the National Institute of Standards and … more

NIST Technique Controls Sizes of Nanoparticle Clusters for EHS Studies
Release Date: 02/02/2011

The same properties that make engineered nanoparticles attractive for numerous applications—small as a virus, biologically and environmentally … more

Real-World Graphene Devices May Have a Bumpy Ride
Release Date: 01/19/2011

Electronics researchers love graphene. A two-dimensional sheet of carbon one atom thick, graphene is like a superhighway for electrons, which … more

NIST Puts a New Twist on the Electron Beam
Release Date: 01/13/2011

'Electron Vortices' Have the Potential to Increase Conventional Microscopes' Capabilities Electron microscopes are among the most widely used … more

NIST Announces $22 Million in Funding for Advanced Manufacturing Research in Electronics, Biotechnology and Nanotechnology
Release Date: 12/15/2010

The U.S. Commerce Department's National Institute of Standards and Technology (NIST) today announced a total of more than $22 million in funding … more

NIST’s New Scanning Probe Microscope is Supercool
Release Date: 12/08/2010

The discoveries of superconductivity, the quantum Hall effect and the fractional quantum Hall effect were all the result of measurements made at … more

Quartz Crystal Microbalances Enable New Microscale Analytic Technique
Release Date: 11/24/2010

A new chemical analysis technique developed by a research group at the National Institute of Standards and Technology (NIST) uses the shifting … more

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