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Nanotechnology News

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NIST ‘Hybrid Metrology’ Method Could Improve Computer Chips
Release Date: 09/05/2012

A refined method developed at the National Institute of Standards and Technology (NIST) for measuring nanometer-sized objects may help computer … more

CNST Researchers Demonstrate Low-Noise, Chip-Based Optical Wavelength Converter
Release Date: 09/05/2012

Scanning electron micrograph of the cross-section of a silicon nitride waveguide designed for the low-noise frequency conversion with a simulation … more

Researchers Determine the Optimum Path for Tracking Fluorescent Nanoparticles Using a Laser
Release Date: 08/29/2012

NIST Center for Nanoscale Science and Technology   researchers Gregg Gallatin and Andrew Berglund (now at Quantifind in Palo Alto, CA) have … more

CNST Releases the Summer 2012 Edition of The CNST News
Release Date: 08/08/2012

The NIST Center for Nanoscale Science and Technology (CNST) is pleased to announce the release of the summer 2012 edition of The CNST News. This … more

NIST Focuses on Testing Standards to Support Lab on a Chip Commercialization
Release Date: 08/08/2012

Lab on a chip (LOC) devices—microchip-size systems that can prepare and analyze tiny fluid samples with volumes ranging from a few microliters … more

Researchers Track Nanoparticle Dynamics in Three Dimensions
Release Date: 08/01/2012

Researchers from the NIST Center for Nanoscale Science and Technology have used three-dimensional single-particle tracking to measure the dynamic … more

Researchers Demonstrate and Explain Surface Conduction in a Topological Insulator
Release Date: 07/11/2012

Researchers at the University of Maryland and the NIST Center for Nanoscale Science and Technology have for the first time experimentally … more

'Tuning' Graphene Drums Might Turn Conductors to Semiconductors
Release Date: 06/27/2012

Tightening or relaxing the tension on a drumhead will change the way the drum sounds. The same goes for drumheads made from graphene, only instead … more

Not-So-Precious: Stripping Gold From AFM Probes Allows Better Measurement of Picoscale Forces
Release Date: 06/27/2012

Gold is not necessarily precious—at least not as a coating on atomic force microscope (AFM) probes. Artist's conception of JILA's advance in … more

Shaffique Adam Receives Singapore National Research Foundation Fellowship
Release Date: 06/27/2012

In July, Shaffique Adam will join the inaugural faculty of Yale-NUS College as an Assistant Professor of Science, with a joint appointment in the … more

Hark! Group Demonstrates First Heralded Single Photon Source Made from Silicon
Release Date: 06/27/2012

In an important step towards more practical quantum information processing, researchers from the National Institute of Standards and Technology … more

Graphene Drumheads Tuned to Make Quantum Dots
Release Date: 06/21/2012

NIST researchers showed that straining graphene membrane creates pseudomagnetic fields that confines the graphene's electrons and creates … more

CNST Releases the Spring 2012 Edition of The CNST News
Release Date: 05/25/2012

The NIST Center for Nanoscale Science and Technology (CNST) is pleased to announce the release of the spring 2012 edition of The CNST News. This … more

Spin Polarized Supercurrents Optimized with a Simple Flip
Release Date: 05/11/2012

Using SEMPA, the magnetic structures in the top and bottom layers of a cobalt-ruthenium-cobalt sandwich contained within a superconducting device … more

Light Touch Keeps a Grip on Delicate Nanoparticles
Release Date: 05/02/2012

Using a refined technique for trapping and manipulating nanoparticles, researchers at the National Institute of Standards and Technology (NIST) … more

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