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Nanotechnology News

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NIST Study Suggests Carbon Nanotubes May Protect DNA from Oxidation
Release Date: 11/14/2012

Researchers at the National Institute of Standards and Technology (NIST) have provided evidence in the laboratory that single-wall carbon … more

Key Property of Graphene Sustained Over Wide Ranges of Density and Energy
Release Date: 11/14/2012

A collaboration led by researchers from the NIST Center for Nanoscale Science and Technology   has shown for the first time that charge carriers in … more

Researchers Observe, Control, and Optimize the Growth of Individual Carbon Nanotubes
Release Date: 10/31/2012

Bright field transmission electron micrograph showing carbon nanotubes grown from an array of equally-sized iron catalyst particles created by … more

Researchers Develop Versatile Optomechanical Sensors for Atomic Force Microscopy
Release Date: 10/24/2012

Top: Scanning electron micrograph of the chip-based optomechanical sensor. Bottom: Schematic of the disk-cantilever sensor geometry. Researchers … more

Slip Sliding Our Way: At the Nanoscale, Graphite Can Turn Friction Upside Down
Release Date: 10/16/2012

If you ease up on a pencil, does it slide more easily? Sure. But maybe not if the tip is sharpened down to nanoscale dimensions. A team of … more

New Method Measures Movements of Tiny Devices-At Every Step
Release Date: 10/16/2012

Makers of minuscule moving machines—the kind being eyed for nanomanufacturing and assembly as well as other uses—do you know where your micro- and … more

Researchers Determine Critical Factors for Improving Performance of a Solar Fuel Catalyst
Release Date: 10/03/2012

False-color scanning electron micrographs of cross-sectioned hematite films grown by sputter deposition and then annealed at two different … more

A Fast and Sensitive Nanophotonic Motion Sensor Developed for Silicon Microdevices
Release Date: 09/19/2012

False-color scanning electron micrograph of a nanophotonic motion sensor. Vertical motion of the silicon nitride ring (pink) changes an evanescent … more

Researchers Introduce New Method for Imaging Defects in Magnetic Nanodevices
Release Date: 09/12/2012

Top: Scanning electron micrograph of an array of magnetic nanodisks with a oval-shaped “defect” structure at center.  Middle: Ferromagnetic … more

NIST ‘Hybrid Metrology’ Method Could Improve Computer Chips
Release Date: 09/05/2012

A refined method developed at the National Institute of Standards and Technology (NIST) for measuring nanometer-sized objects may help computer … more

CNST Researchers Demonstrate Low-Noise, Chip-Based Optical Wavelength Converter
Release Date: 09/05/2012

Scanning electron micrograph of the cross-section of a silicon nitride waveguide designed for the low-noise frequency conversion with a simulation … more

Researchers Determine the Optimum Path for Tracking Fluorescent Nanoparticles Using a Laser
Release Date: 08/29/2012

NIST Center for Nanoscale Science and Technology   researchers Gregg Gallatin and Andrew Berglund (now at Quantifind in Palo Alto, CA) have … more

CNST Releases the Summer 2012 Edition of The CNST News
Release Date: 08/08/2012

The NIST Center for Nanoscale Science and Technology (CNST) is pleased to announce the release of the summer 2012 edition of The CNST News. This … more

NIST Focuses on Testing Standards to Support Lab on a Chip Commercialization
Release Date: 08/08/2012

Lab on a chip (LOC) devices—microchip-size systems that can prepare and analyze tiny fluid samples with volumes ranging from a few microliters … more

Researchers Track Nanoparticle Dynamics in Three Dimensions
Release Date: 08/01/2012

Researchers from the NIST Center for Nanoscale Science and Technology have used three-dimensional single-particle tracking to measure the dynamic … more

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