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Researchers Develop Versatile Optomechanical Sensors for Atomic Force Microscopy
Release Date: 10/24/2012 < more
Slip Sliding Our Way: At the Nanoscale, Graphite Can Turn Friction Upside Down
Release Date: 10/16/2012 If you ease up on a pencil, does it slide more easily? Sure. But maybe not if the tip is sharpened down to nanoscale dimensions. A team of … more
New Method Measures Movements of Tiny Devices-At Every Step
Release Date: 10/16/2012 Makers of minuscule moving machines—the kind being eyed for nanomanufacturing and assembly as well as other uses—do you know … more
Researchers Determine Critical Factors for Improving Performance of a Solar Fuel Catalyst
Release Date: 10/03/2012 False-color scanning electron micrographs of cross-sectioned hematite films grown by sputter deposition and then annealed at two different … more
A Fast and Sensitive Nanophotonic Motion Sensor Developed for Silicon Microdevices
Release Date: 09/19/2012 False-color scanning electron micrograph of a nanophotonic motion sensor. Vertical motion of the silicon nitride ring (pink) changes an evanescent … more
Researchers Introduce New Method for Imaging Defects in Magnetic Nanodevices
Release Date: 09/12/2012 Top: Scanning electron micrograph of an array of magnetic nanodisks with a oval-shaped “defect” structure at center. … more
NIST ‘Hybrid Metrology’ Method Could Improve Computer Chips
Release Date: 09/05/2012 A refined method developed at the National Institute of Standards and Technology (NIST) for measuring nanometer-sized objects may help computer … more
CNST Researchers Demonstrate Low-Noise, Chip-Based Optical Wavelength Converter
Release Date: 09/05/2012 Scanning electron micrograph of the cross-section of a silicon nitride waveguide designed for the low-noise frequency conversion with a simulation … more
Researchers Determine the Optimum Path for Tracking Fluorescent Nanoparticles Using a Laser
Release Date: 08/29/2012 NIST Center for Nanoscale Science and Technology researchers Gregg Gallatin and Andrew Berglund (now at Quantifind in Palo Alto, CA) … more
CNST Releases the Summer 2012 Edition of The CNST News
Release Date: 08/08/2012 The NIST Center for Nanoscale Science and Technology (CNST) is pleased to announce the release of the summer 2012 edition of The CNST News. This … more
NIST Focuses on Testing Standards to Support Lab on a Chip Commercialization
Release Date: 08/08/2012 Lab on a chip (LOC) devices—microchip-size systems that can prepare and analyze tiny fluid samples with volumes ranging from a few … more
Researchers Track Nanoparticle Dynamics in Three Dimensions
Release Date: 08/01/2012 Researchers from the NIST Center for Nanoscale Science and Technology have used three-dimensional single-particle tracking to measure the dynamic … more
Researchers Demonstrate and Explain Surface Conduction in a Topological Insulator
Release Date: 07/11/2012 Researchers at the University of Maryland and the NIST Center for Nanoscale Science and Technology have for the first time experimentally … more
'Tuning' Graphene Drums Might Turn Conductors to Semiconductors
Release Date: 06/27/2012 Tightening or relaxing the tension on a drumhead will change the way the drum sounds. The same goes for drumheads made from graphene, only instead … more
Not-So-Precious: Stripping Gold From AFM Probes Allows Better Measurement of Picoscale Forces
Release Date: 06/27/2012 Gold is not necessarily precious—at least not as a coating on atomic force microscope (AFM) probes. Artist's conception of … more |
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