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In an arranged marriage of optics and mechanics, physicists have created microscopic structural beams that have a variety of powerful uses when light strikes
Scientists at the National Institute of Standards and Technology (NIST) have developed a new device that measures the motion of super-tiny particles traversing
You may have seen it on CSI: The star examines hair from a crime scene and concludes its color or texture looks like the defendant’s hair, or maybe his dog’s
Nano and atomic scale theory of the electronic, optical and mechanical properties of ultrasmall structures, such as semiconductor quantum dots and dopants in Si
Scientists and engineers currently have a growing library of synthetic microscale and nanoscale swimmers which affect the hydrodynamics of their surroundings in
Local material-property information is essential to evaluate emerging micro- and nanoscale materials, which many manufacturers would like to leverage for their
This project provides measurement solutions that probe the surface and internal structure of polymer membranes used in water purification, and correlate that
Diego Perez Morelo, Mingkang Wang, Venkatesh Madhaven, Mogana Sathisivan, Charlie Tay, Vladimir Aksyuk
Chip-scale planar nanofabricated optomechanical devices that optically couple a mechanical moving nanostructure to an on-chip photonic cavity of high quality
The ability to prepare a macroscopic mechanical resonator into a quantum superposition state is an outstanding goal of cavity optomechanics. Here, we propose a
Mingkang Wang, Diego Perez Morelo, Georg Ramer, Georges Pavlidis, Jeffrey Schwartz, Liya Yu, Robert Ilic, Andrea Centrone, Vladimir Aksyuk
Thermal fluctuations often impose both fundamental and practical measurement limits on high-performance sensors, motivating the development of techniques that
Richard S. Gates, William Alexander Osborn, Mark McLean, Gordon A. Shaw, James J. Filliben
A batch of 94 silicon chips containing arrays of uniform rectangular cantilevers were microfabricated from a single silicon wafer and their stiffnesses and