NIST logo
NIST Home > Nanomechanics News 
 

Nanomechanics News

(showing 1 - 15 of 24)
CNST Releases the Winter/Spring 2014 Edition of The CNST News
Release Date: 05/28/2014

The NIST Center for Nanoscale Science and Technology (CNST) is pleased to announce the release of the Winter/Spring 2014 edition of The CNST News. … more

CNST Releases the Fall 2013 Edition of The CNST News
Release Date: 11/14/2013

The NIST Center for Nanoscale Science and Technology (CNST) is pleased to announce the release of the Fall 2013 edition of The CNST News . This … more

New Temporal Filtering Technique Improves Solid-State Single Photon Sources
Release Date: 05/08/2013

Schematic showing a single photon source (SPS) that is created from a quantum dot (QD) by optically pumping it with a periodically pulsed laser.  … more

New NIST Measurement Tool Is On Target for the Fast-Growing MEMS Industry
Release Date: 04/30/2013

As markets for miniature, hybrid machines known as MEMS grow and diversify, the National Institute of Standards and Technology (NIST) has … more

Nanowire Position and Orientation Precisely Controlled Using Fluid Flow
Release Date: 04/11/2013

Video showing a 10 µm × 1 µm fluorescently labeled rod being controlled using a combination of electric fields and fluid flow to travel along the … more

New Platform Developed to Measure and Exploit Optomechanical Interactions
Release Date: 12/12/2012

A pair of nanobeams is held side-by-side and separated by a nanoscale gap, with one beam supporting a mechanical mode, and the other supporting a … more

Researchers Develop Versatile Optomechanical Sensors for Atomic Force Microscopy
Release Date: 10/24/2012

Top: Scanning electron micrograph of the chip-based optomechanical sensor. Bottom: Schematic of the disk-cantilever sensor geometry. Researchers … more

Slip Sliding Our Way: At the Nanoscale, Graphite Can Turn Friction Upside Down
Release Date: 10/16/2012

If you ease up on a pencil, does it slide more easily? Sure. But maybe not if the tip is sharpened down to nanoscale dimensions. A team of … more

New Method Measures Movements of Tiny Devices-At Every Step
Release Date: 10/16/2012

Makers of minuscule moving machines—the kind being eyed for nanomanufacturing and assembly as well as other uses—do you know where your micro- and … more

A Fast and Sensitive Nanophotonic Motion Sensor Developed for Silicon Microdevices
Release Date: 09/19/2012

False-color scanning electron micrograph of a nanophotonic motion sensor. Vertical motion of the silicon nitride ring (pink) changes an evanescent … more

Researchers Introduce New Method for Imaging Defects in Magnetic Nanodevices
Release Date: 09/12/2012

Top: Scanning electron micrograph of an array of magnetic nanodisks with a oval-shaped “defect” structure at center.  Middle: Ferromagnetic … more

CNST Releases the Summer 2012 Edition of The CNST News
Release Date: 08/08/2012

The NIST Center for Nanoscale Science and Technology (CNST) is pleased to announce the release of the summer 2012 edition of The CNST News. This … more

CNST Releases the Spring 2012 Edition of The CNST News
Release Date: 05/25/2012

The NIST Center for Nanoscale Science and Technology (CNST) is pleased to announce the release of the spring 2012 edition of The CNST News. This … more

Researchers Validate Simplified Lateral Force Calibration Technique for Atomic Force Microscopy
Release Date: 03/28/2012

In the diamagnetic lateral force calibration method, an AFM cantilever (shown here is a NIST HammerHead cantilever) presses against the surface of … more

Contact
General Information:
301-975-NIST (6478)
inquiries@nist.gov

100 Bureau Drive, Stop 1070
Gaithersburg, MD 20899-1070