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Nanomechanics Portal

Programs and Projects
Micro- and Nanoelectromechanical Systems

Microelectromechanical systems (MEMS) are integrated devices with critical applications in sensing, timing, signal processing, and biomedical … more

Strain Mapping and Simulation

We employ combined measurement and modeling to enhance understanding and capability of nanoscale strain-mapping via super-resolution confocal … more

Strain fields and phase distribution maps of indented Si

In Raman-spectroscopy enhanced IIT, an indentation device that is coupled with a Raman microscope to conduct in situ spectroscopic and optical … more

Nanoscale Stress Measurements and Standards

Our objective is to develop accurate measurement methods for the nanoscale stress distributions and surface defects that control device … more

Nanoscale Strength Measurements and Standards

To develop new mechanical test structures and methodologies based on microelectromechanical and nanoelectromechanical systems (MEMS and NEMS) … more

Scanning Probe Microscopy Measurements and Standards

Our goal is to develop standard reference materials and quantitative, reproducible, measurement methods and protocols for scanning probe … more

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General Information:
301-975-NIST (6478) Telephone
inquiries@nist.gov Email

100 Bureau Drive
Gaithersburg, MD 20899-8110

Technical Contact:
Lloyd Whitman