Jun Young Chung, Ph.D.

Research Interests

• Surface wrinkling metrology
• Self-assembled and self-organized patterns
  
• Instability, adhesion, friction, and fracture at soft interfaces
• Biomimetic and bioinspired materials design
  
  

Awards and Honors

• NIST Sigma Xi Postdoctoral Poster Session 1st Place, "Surface wrinkling metrology for nanoscale polymeric materials," (Feb. 2008)
• Best Poster Presentation Award in Gordon Research Conference - Adhesion, Science of, "Roles of discontinuities and crack propagation in thin elastic films," (Aug. 2004)
• Ticona Excellence Award for Outstanding Achievement in Graduate Research, Society of Plastics Engineers, "Model studies of fouling release and bio-inspired adhesion," (Oct. 2003)

Selected Non-NIST Publications

J.Y. Chung, A.J. Nolte, C.M. Stafford, "Diffusion-controlled, self-organized growth of symmetric wrinkling patterns." Advanced Materials, ASAP (2009).

A.J. Nolte, J.Y. Chung, M.L. Walker, C.M. Stafford, "In situ adhesion measurements utilizing layer-by-layer functionalized surfaces." ACS Applied Materials & Interfaces, ASAP (2009).

J.Y. Chung, K.H. Kim, M.K. Chaudhury, J. Sarkar, A. Sharma. "Confinement-induced instability and adhesive failure between dissimilar thin elastic films." European Physical Journal E, 20, 47 (2006).