Summary:Our goal is to provide medical device manufacturers with critical data, new test structures, and standard test procedures to improve the quality, reliability, and consistency of active implantable medical devices. These devices, including pacemakers, cardiac defibrillators, and neural stimulators, have unacceptably high failure rates. For current devices, we are establishing new test requirements for discrete electronic components, which are often the source of failure. For next-generation devices, we are developing test structures to evaluate alternative packaging materials, which have unproven reliability. Description:
Our Approach: To improve acceptance testing of medical electronics, we are assessing a suite of potential acceleration factors and mapping the observed failure modes to those found in explanted devices. Multilayer ceramic capacitors are the focus, as changes in the properties of these components often result in device failure. We are also gathering critical data on next-generation packaging, where conformal coatings will serve as the primary interface between the device and the biological environment. Our initial focus is parylene, which is already used to coat neural recording electrodes and is proposed to replace metal canisters in implantable cardiac defibrillators. Additional Technical Details:For more information, see:
Major Accomplishments:
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![]() Start Date:October 1, 2006End Date:ongoingLead Organizational Unit:MSELCustomers/Contributors/Collaborators:NIST is working with the iNEMI Medical Electronics team to address short- and long-term reliability issues with medical devices. Our collaborators include Boston Scientific, Guidant, Medtronic, St. Jude Medical, Cochlear, Ltd., Biotronik, Med-El, Advanced Bionics, Vishay, AVX, and Kemet. Facilities/Tools Used:
Staff:Grady White (Project Leader) Damian Lauria (Lab Automation Engineer) Mailasu Bai (Materials Research Engineer)
Grady White |