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Welcome

The Structure Determination Methods Group develops and disseminates measurement science, standards, and technology for the determination of the structures of advanced materials via: standard reference materials; standard reference databases; X-ray, electron, and neutron diffraction methods; synchrotron and neutron scattering methods; and computational tools. The Group’s activities are carried out in five project areas: Diffraction Metrology, Thin Film X-ray Reflectometry, Local Structure, Phase Equilibrium Data, and Crystallographic Databases.

Programs/Projects
Ceramic Phase Equilibrium Data — Our objective is to compile, evaluate, determine, and disseminate phase equilibrium data to facilitate and optimize the development, processing, and usage of advanced ceramic materials. By …
 
Crystallographic Databases — Our objective is to provide critically evaluated, comprehensive crystal structure databases to enable materials identification required for the development of inorganic materials and devices. Our …
 
Diffraction Metrology and Standards — Our objective is the development of Standard Reference Materials (SRMs) and quantitative, reproducible, and accurate measurement methods for characterization of any structure possessing spatial …
 
Measurement and Prediction of Local Structure in Electronic Ceramics — Our goal is to provide analytical tools that allow measurement and prediction of local structure to enable the development of ceramic materials for electronic applications. Under this project, we …
 
Thin Film X-Ray Reflectometry — Our goal is to develop Standard Reference Materials (SRMs) and quantitative, reproducible X-ray reflectometry (XRR) data analysis methods to enable accurate measurement of film thickness, …
 
 
Contact
Ceramics Division

Structure Determination Methods Group
Terrell Vanderah, Group Leader

100 Bureau Drive, M/S 8520
Gaithersburg, MD 20899

301-975-5785 Telephone
301-975-5334 Facsimile