Dr. Lawrence Friedman

Research Interests

Nanomechanical Modeling and Simulation:

• Continuum, Multiscale and Stochastic methods
• Nanoscale Pattern Formation / Self-Assembly
• Stress and Strain in Nanostructures and Nanostructured Materials
  

Areas of Application:

• Nanomechanical Standards for Atomic Force Microscopy
• Simulation of Self-Assembled Quantum Dot formation
• Energy of surfaces and internal interfaces
• Nanoindentation and Nanomechanical Measurement
  

Selected Recent Publications Prior to Joining NIST

• Lei Fang and Christopher L. Muhlstein and James G. Collins and Amber L. Romasco and Lawrence H. Friedman. “Continuous electrical in situ contact area measurement during instrumented indentation. Journal of Materials Research. 23(9): 2480-2485 (2008).[DOI: 10.1557/JMR.2008.0298]

• L. H. Friedman, Surface Energy Effects on the Self-Assembly of Epitaxial Quantum Dots, Proc. SPIE, Vol. 7224, 722405 (Feb. 13, 2009).[DOI:10.1117/12.809796]

• L. H. Friedman, Stochastic continuum modeling self-assembled epitaxial quantum dot formation. Proc. SPIE, Vol. 7041, 704103 (2008) [DOI:10.1117/12.795615]

• L. H. Friedman, Anisotropy and Morphology of Strained III-V Heteroepitaxial Films, Physical Review B, 78, 193302 (4 pages) (2008). [DOI:10.1103/PhysRevB.78.193302]

• Chandan Kumar and Lawrence H. Friedman, Effects of elastic heterogeneity and anisotropy on the morphology of self-assembled epitaxial quantum dots Journal of Applied Physics, 104, 034902 (2008). [DOI:10.1063/1.2960560]