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NIST Home > MML > Surface and Microanalysis Science Division > Analytical Microscopy Group > Albert Fahey
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Albert Fahey

Selected Publications
  • Performance of a C60+ Ion Source on a Dynamic SIMS Instrument
  • Application of the Hadamard Transform to T0F-SIMS
  • Secondary Ion Mass Spectrometry Isotope Ration Data of Uranium Oxide Particles and Detection of Groupings
Latest Publications
  • 3-Dimensional Compositional Analysis in Drug Eluting Stent (DES) Coatings Using Cluster Secondary Ion Mass Spectrometry (Cluster SIMS)
  • Temperature-Controlled Depth Profiling in Poly(methylmethacrylate) (PMMA) Using Cluster Secondary Ion Mass Spectrometry (SIMS): I. Investigation of Depth Profile Characteristics
  • Temperature-Controlled Depth Profiling in Poly (methylmethacrylate) (PMMA) Using Cluster Secondary Ion Mass Spectrometry (SIMS) II. An Investigation of Sputter-Induced Topography, Chemical Damage and Depolymerization Effects
More...
Albert Fahey

Position:

Physicist
Surface and Microanalysis Science
Analytical Microscopy
Contact

Phone: 301-975-2185
Email: albert.fahey@nist.gov
Fax: 301-417-1321


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Date created: February 11, 2009 | Last updated: October 5, 2010    Contact: Webmaster