Karen T. Henry

 Karen T. Henry is a National Research Council post-doctoral associate with the Surface and Microanalysis Science Division at NIST. Karen received a B.S. (2005) in Aerospace Engineering, an M.S. (2006) in Aerospace Engineering, and a Ph.D. (2010) in Metallurgical Engineering from the University of Alabama (Tuscaloosa, AL). Her dissertation research focused on the characterization of nanostructured materials including metallic thin films, nanoparticles, and soft magnetic ribbons. Karen specifically used convergent-beam electron diffraction (CBED), x-ray diffraction (XRD), and atom probe tomography (APT) to study the A1 to L10 polymorphic transformation in FePt thin films. Karen is now actively developing a method for three-dimensional atom probe (3DAP) reconstructions to accurately characterize non-hemispherical end shapes in complex engineered nanostructures, such as next-generation nanoelectronic devices.

Dissertation Publications (as Karen L. Torres):
K.L. Torres and G.B. Thompson “Grain boundary enrichment in the FePt polymorphic A1 to L10 phase transformation,” Ultramicroscopy 109 (2009) 606-611.
K.L. Torres, M. Daniil, M.A. Willard and G.B. Thompson “The influence of voxel size on atom probe tomography data,” Ultramicroscopy (2011).
K.L. Torres, B. Geiser, M.P. Moody, S.P. Ringer and G.B. Thompson “Field evaporation behavior in [001] FePt thin films,” Ultramicroscopy (2011).
K.L. Torres, R.R. Vanfleet and G.B. Thompson “Dynamical diffraction simulations in chemically ordered FePt – I,” Microscopy and Microanalysis (2011).
K.L. Torres, R.R. Vanfleet and G.B. Thompson “Comparison of simulated and experimental order parameters in FePt – II,” Microscopy and Microanalysis (2011).