Andrew Konicek

Andrew Konicek is a NRC postdoc with the Surface and Microanalysis Science Division at NIST. Andrew received his B.A. (2004) in Physics from Gustavus Adolphus College (St. Peter, MN), a M.A. (2007) in Physics from the University of Wisconsin-Madison (Madison, WI), and his Ph.D. (2010) in Physics from the University of Pennsylvania (Philadelphia, PA). His dissertation work involved studying the tribological behavior of ultrahard carbon films with extreme properties using synchrotron-based chemical characterization techniques (near-edge x-ray absorption fine structure (NEXAFS) spectroscopy, and photoelectron emission microscopy (PEEM) with NEXAFS). Andrew’s postdoctoral research at NIST is focusing on studying the properties of metal oxide materials used for chemical sensors by employing techniques such as scanning electron microscopy (SEM) and Auger electron spectroscopy (AES).