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NIST Home > MML > Surface and Microanalysis Science Division > Dale E Newbury
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Dale E. Newbury

Latest Publications
  • Compton Scattering Artifacts in Electron Excited X-ray Spectra Measured with a Silicon Drift Detector
  • Mistakes Encountered During Automatic Peak Identification in Low Beam Energy X-Ray Microanalysis
  • Preface for Special Issue of Surface and Interface Analysis with the Proceedings of the NIST Workshop on 'Modeling Electron Transport for Applications in Electron and X-ray Analysis and Metrology'
More...
Dale Newbury Staff Photo

Position:

NIST Fellow
Surface and Microanalysis Science Division
Contact

Phone: (301) 975-3921
Email: dale.newbury@nist.gov

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Date created: March 16, 2009 | Last updated: October 5, 2010    Contact: Webmaster