Our goal is to address the metrology of magnetic effects at the nanoscale level. Nanomagnet arrays form the basis for major data storage technologies, notably magnetoresistive random access memory and bit-patterned media for ultra-high density storage devices. Moreover, the semiconductor industry is looking beyond conventional CMOS processing, where current lithography techniques are expected to fail.Although fabrication methods for post-CMOS circuitry have not been established, it is certain that the magnetic components involved will be in the nanometer range.Although defects are expected to dominate device behavior at this range, the metrology of defect-induced magnetic effects has not been developed at this scale.
We focus primarily on arrays of magnetic nanostructures in order to reveal how defects alter the fundamental physics of magnetization reversal processes in the nanometer regime. We have an integrated approach that consists of four inter-related elements. The first element, film edge metrology, addresses the role of the edge on magnetic behavior uniformity in magnetic nanostructures. The second element, magneto-optical nanostructure spectroscopy, is meant to provide fast and precise individual nanostructure “fingerprints”. Another element, microscopy, provides quantitative microstructure and defect information that can be correlated with magnetic behavior. Finally, nanomagnetic modeling element offers an efficient and accurate theoretical predictive tool.
Magnetization reversal in nanodots
Edge roughness on the nanoscale correlates to switching behavior
Determining nucleation field in nanostructures
Microstructural origin of switching field distribution
Trigger grain causes SFD in Co/Pd nanodots
Thin film edge magnetic properties varies with patterning process conditions
Measured resonances in nanostripes
Micromagnetics on curved geometries using rectangular cells
Edge modes test the robustness of correction
Start Date:October 1, 2007
End Date:September 30, 2012
Lead Organizational Unit:mml
Project Summary (PDF)
June W. Lau