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Surface and Interface Research Group


The Surface and Interface Research Group conducts research on the development of innovative metrologies and measurement protocols for micro/nano-scale heterosystems analysis. Measurement techniques are used to determine sample composition as well as structural, electronic, and chemical properties of a wide variety of organic, inorganic and biomolecular systems where materials of interest are typically present as either micro/nano-scale features or monolayer/multilayer films.


Nanotechnology—Key metrologies/systems: Superresolving optical microscopy/Coherent anti-Stokes Raman scattering; Scanning Kelvin probe microscopy/Organic thin film transistors; Focused-ion beam/ZnO nanowires and …

Materials Science—Key metrologies/systems: In situ spectroscopic ellipsometry, linear and non-linear spectroscopies/Polymeric thiophene-based semiconductors for flexible large area electronics. Advanced platforms …

Energy—Key metrologies/systems: Scanning tunneling microscopy and one- and two-photon photoemission/Model organic heterostructures - pentacene:C60 and metal phthalocyanine:C60. Advanced platforms and …

Chemistry—Key metrologies/systems: Near-infrared (IR) supercontinuum light sources/long-path absorbance Fourier transform IR spectrometry. Advanced platforms and protocols are being developed towards …

Bioscience and Health—Key metrologies/systems: In situ spectroscopic ellipsometry/Self-assembled monolayer resistance to protein/surface binding. Advanced platforms and protocols are being developed towards the …


Group Logo Scanning Tip
Credit: NIST


General Information:
Dr. Steven A. Buntin
301-975-2989 Telephone
301-417-1321 Facsimile

100 Bureau Drive, M/S 8371
Gaithersburg, MD 20899-8371