Evaluate and standardize crystallographic databases for inorganic materials, and provide support for flexible searching of the databases; use computational tools to generate calculated data to meet the demands for the increased device functionality from academia and industry.
Combine statistical methods with materials databases to expedite experimental data processing, optimize materials design and provide guidance for knowledge discovery.
X-ray diffraction and electron microscopy:
Structure and chemistry determination using XRD and Electron Microscopy, identify structure-property relationships.
Figure 1(left): PC interface for searching FIZ/NIST Inorganic Crystal Structure Database (ICSD, NIST Standard Reference Database 84); Figure 2(right): Crystal structure of Al5.6 Cu1 Li2.9, generated from the information stored in crystallographic database.
Figure 3: Phase identification from combinatorial experiments using calculated diffraction data.
Materials Engineer, NIST Associate
Structure Determination Methods Group
2002-present: Research Associate, Ceramics Division, NIST
2005-present: Postdoctoral Research Associate, George Mason University
2004-2005: Postdoctoral Research Associate, Rensselaer Polytechnic Institute
1996-1998: Engineer, SAE Magnetics, China
Ph.D., Materials Science, Rensselaer Polytechnic Institute, 2003
M.S., Materials Science, Southeast University, China, 1996
B.S., Materials Science, Hefei University of Technology, China, 1993