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Workshop on Measurement Needs for Local Structure Determination in Inorganic Materials

On February 20-21, 2008, Structure Determination Methods Group researchers held a workshop on measurements of local atomic structure in inorganic materials.  This NIST-sponsored meeting was motivated by the current lack of effective measurement solutions for accurate and comprehensive determination of atomic arrangements at the nanoscale—a problem at the core of nanotechnology:  the local structure, not the long-range order, determines the material properties critical for many nanotechnology applications.  The primary goal of the workshop was to devise a strategy for building the coherent interdisciplinary effort required for solving this highly complex problem.  The activity brought together experts in the key experimental and theoretical areas relevant to local structure determination from industry (SEMATECH, GE, Rigaku, EXXONMobil, IBM, Ford, Alcatel-Lucent, Aerospace Corp., Ineos Technologies), academe, and government agencies (NIST, ANL, BNL, ORNL, NSF, DOE, LANL). 

Contact

Terrell A. Vanderah
301-975-5785 Telephone
301-975-5334 Facsimile
terrell.vanderah@nist.gov 

100 Bureau Drive, M/S 8520
Gaithersburg MD 20899