- Development and application of methods and traceable techniques for quantitative measurements of mechanical properties at the micro and nanoscale
- Development of piezospectrocopic measurement methods for nanoscale strain distribution in materials
- Design, construction and use of indentation instruments with in-situ capabilities of optical and Raman microscopy
Figure 1(left): Hardness alteration at crystallinity boundary in a HfO2-TiO2-Y2O3 library thin film.; Figure 2(center): Statistical study of the material response (elastic, plastic, phase transformation) of Si(110) wafer as function of indentation force.; Figure 3(right): Map of stress component σxx around the spherical imprint in a Si(111) wafer.
Awards and Honors
- Adam Opel Preis of University of Applied Science Schmalkalden, Best Diploma thesis in Department of Engineering, 1999
Materials Measurement Science Division
Nanomechanical Properties Group
2006-present: NIST Associate, Ceramics Division, NIST
2001-2006: Paid PhD student position, CSEM Swiss Center of Electronics and Microtechnology Inc.
1999-2001: Research & Development Engineer, CSEM Swiss Center of Electronics and Microtechnology Inc., Neuchâtel
Ph.D., Engineering, University of Warwick, 2007
Dipl.-Ing. (FH), Mechanical Engineering, University of Applied Science Schmalkalden, 1999