Dr. Yvonne Gerbig

Research Interests

• Development and application of methods and traceable techniques for quantitative measurements of mechanical properties at the micro and nanoscale
  
• Development of piezospectrocopic measurement methods for nanoscale strain distribution in materials
  
• Design, construction and use of indentation instruments with in-situ capabilities of optical and Raman microscopy

Figure 1(left): Hardness alteration at crystallinity boundary in a HfO2-TiO2-Y2O3 library thin film.; Figure 2(center): Statistical study of the material response (elastic, plastic, phase transformation) of Si(110) wafer as function of indentation force.; Figure 3(right): Map of stress component σxx around the spherical imprint in a Si(111) wafer.

Awards and Honors

• Adam Opel Preis of University of Applied Science Schmalkalden, Best Diploma thesis in Department of Engineering, 1999