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Dr. Yvonne Gerbig

Research Interests

  • Development and application of methods and traceable techniques for quantitative measurements of mechanical properties at the micro and nanoscale
  • Development of piezospectrocopic measurement methods for nanoscale strain distribution in materials
  • Design, construction and use of indentation instruments with in-situ capabilities of optical and Raman microscopy

 

Gerbig_staff_Figure

Figure 1(left): Hardness alteration at crystallinity boundary in a HfO2-TiO2-Y2O3 library thin film.; Figure 2(center): Statistical study of the material response (elastic, plastic, phase transformation) of Si(110) wafer as function of indentation force.; Figure 3(right): Map of stress component σxx around the spherical imprint in a Si(111) wafer.

Awards and Honors

  • Adam Opel Preis of University of Applied Science Schmalkalden, Best Diploma thesis in Department of Engineering, 1999
yvonne_gerbig2_photo

Position:

NIST Associate
Ceramics Division
Nanomechanical Properties Group

Employment History:

2006-present: NIST Associate, Ceramics Division, NIST
2001-2006: Paid PhD student position, CSEM Swiss Center of Electronics and Microtechnology Inc.
1999-2001: Research & Development Engineer, CSEM Swiss Center of Electronics and Microtechnology Inc., Neuchâtel

Education:

Ph.D., Engineering, University of Warwick, 2007
Dipl.-Ing. (FH), Mechanical Engineering, University of Applied Science Schmalkalden, 1999

Contact

Phone: 301-975-6130
Email: yvonne.gerbig@nist.gov
Fax: 301-975-5334