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Figure 1: A force cell (brass cover, foreground) for traceable force calibration of micro- and nano-mechanical testing instruments. The cell covers the force range from 5 µm to 5 mN with 0.25 % accuracy or better. In the background is a turret loading system for automated calibration using NIST-traceable mass artifacts (small stainless steel wires) covering the range 0.5 mg to 500 mg.
Figure 2(right): A schematic of a fiber-optic interferometer system designed and built at NIST that is capable of measuring changes in the length of a Fabry-Perot cavity with 2 pm resolution for quasistatic changes, and with 40 fm resolution when using AC dithering of the cavity length. The interferometer output can, for example, be used to servo-control the position of an atomic probe above or in contact with a surface with long-term picometer-level stability.
Figure 3: (a) Quantized electrical conduction through a single-atom contact between a gold probe and a gold surface as the probe position is moved a total of approximately 3 nm (b). The probe position is stabilized using the interferometer system shown in Figure 2.
Postdoctoral Research Opportunities:
Awards and Honors
Materials Measurement Science Division
Nanomechanical Properties Group
2006-present: Physicist, Ceramics Division, NIST
Ph.D., Physics, University of Massachusetts, 1988