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Nanomechanical Properties Group

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The Nanomechanical Properties Group develops and provides mechanical measurement science, measurement standards, and measurement technology needed by U.S. industry to apply materials and components in nanomechanical applications. The Group’s activities are carried out in four project areas:

Programs/Projects

Validation: Coevolved Experimentation and Computation at the Nanoscale—The increased speed and increased size of datasets implemented in modern computational systems has enabled the size scale of models of materials to be increased significantly. In parallel, the …

Strain Mapping and Simulation—We employ combined measurement and modeling to enhance understanding and capability of nanoscale strain-mapping via super-resolution confocal Raman microscopy (CRM), electron back scattered …

Concurrent Experiments and Simulations of Zinc Oxide Nanowires—As part of NIST's response to the Materials Genome Initiative (MGI), this project seeks to unite contact-resonance atomic force microscopy and molecular dynamics simulation, which are capable of …

Investigating the Diameter-Dependence of Elastic Moduli of Zinc Oxide Nanowires using Molecular Dynamics Simulations—As part of NIST's response to the Materials Genome Initiative (MGI), this project addresses conflicting reports of the diameter-dependence of elastic moduli of zinc oxide (ZnO) nanowires. A series …

Strain fields and phase distribution maps of indented Si—In Raman-spectroscopy enhanced IIT, an indentation device that is coupled with a Raman microscope to conduct in situ spectroscopic and optical analysis of mechanically deformed regions of …

Nanoscale Mechanics by Contact Resonance Atomic Force Microscopy—Atomic force microscopy (AFM) provides unique accessibility at the nanoscale. Capabilities in terms of nanoscale mechanical property measurements are added to AFM by contact-resonance AFM (AFM) for …

Nanoscale Stress Measurements and Standards—Our objective is to develop accurate measurement methods for the nanoscale stress distributions and surface defects that control device performance and reliability (performance over service life) …

Scanning Probe Microscopy Measurements and Standards—Our goal is to develop standard reference materials and quantitative, reproducible, measurement methods and protocols for scanning probe microscopes, to enable accurate dimensional, force, and …

Nanoparticle Measurements and Standards for Biomedical Applications and Health—Our goal is to develop certified reference materials, standard test methods, measurements, and critical data for the physicochemical characterization of engineered and multifunctional …

Nanoscale Strength Measurements and Standards—To develop new mechanical test structures and methodologies based on microelectromechanical and nanoelectromechanical systems (MEMS and NEMS) manufacturing methods that enable device producers in …