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Key metrologies/systems: In situ spectroscopic ellipsometry, linear and non-linear spectroscopies/Polymeric thiophene-based semiconductors for flexible large area electronics. Advanced platforms and protocols are being developed towards innovative metrology suites that allow the full characterized the structure-function relationships of polymeric semiconductors, including functionalized thiophene species, under a variety processing conditions.
Optical Characterization of Thin Films
A wide range of technologies are impacted by the performance of thin (<100 nm) layers of advanced materials. This is particularly true in the emerging macroelectronics industry and in biomaterials. Rational development of these materials is hampered by the lack of structure-function relationships due to a severe lack of adequate data/measurement tools for molecular level characterization of thin films. The traditional structural tools of x-ray diffraction and NMR are severely limited due to lack of signal and contrast. The focus of this project is developing and demonstrating the ability of bench-top optical tools, combined with advanced physical models to determine the details of molecular structure in thin films and at interfaces. Specific emphasis is placed on polarized photon spectroscopies: spectroscopic ellipsometry, infrared absorption, broadband ultrafast laser-based sum frequency generation and coherent anti-Stokes Raman scattering.
Lead Organizational Unit:mml