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NIST Home
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Materials Measurement Science Division
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Analytical Microscopy Group
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Jennifer Verkouteren
*
Jennifer Verkouteren
Selected Publications
XRD Rietveld Simulations Y
2
O
3
- ZrO
2
Phases
Automated Mapping of Explosives Particles in Composition C-4 Fingerprints
IMS-Based Trace Explosives Detectors for First Responder Use
Latest Publications
Inkjet Metrology II: Resolved Effects of Ejection Frequency, Fluidic Pressure and Droplet Number on Reproducible Drop-on-Demand Dispensing
Reliability of Ion Mobility Spectrometry for Qualitative Analysis of Complex, Multicomponent Illicit Drug Samples
Automated Mapping of Explosives Particles in Composition C-4 Fingerprints
More...
Position:
Physical Scientist
Surface and Microanalysis Science
Analytical Microscopy Group
Contact
Phone:
301-975-2186
Email:
jennifer.verkouteren@nist.gov
Fax:
301-417-1321