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Albert Fahey

Selected Publications

Latest Publications

Bridging the Micro to Macro Gap: A New Application for Milli-probe X-ray Fluorescence
3-Dimensional Compositional Analysis in Drug Eluting Stent (DES) Coatings Using Cluster Secondary Ion Mass Spectrometry (Cluster SIMS)
Temperature-Controlled Depth Profiling in Poly(methylmethacrylate) (PMMA) Using Cluster Secondary Ion Mass Spectrometry (SIMS): I. Investigation of Depth Profile Characteristics

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Albert Fahey

Position:

Physicist
Surface and Microanalysis Science
Analytical Microscopy

Contact

Phone: 301-975-2185
Email: albert.fahey@nist.gov
Fax: 301-417-1321