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Douglas C. Meier holds a B.A. in Chemistry from Northwestern University and a Ph.D. in Chemistry from Texas A&M University, where he studied the chemical physics of model catalyst systems under the guidance of Professor D. Wayne Goodman. Dr. Meier was subsequently awarded a National Research Council Postdoctoral Research Associateship in the Process Sensing Group at the National Institute of Standards and Technology (NIST), during which he applied his training in surface chemistry and thin film science to the development of advanced chemical microsensor arrays for volatile organic compounds, toxic industrial chemicals, and chemical warfare agents. For these efforts, he was awarded the United States Department of Commerce Silver Medal. Currently a NIST Research Chemist in the Surface and Microanalysis Science Division, Dr. Meier utilizes tools such as Auger electron microscopy to perform fundamental studies on materials at the nanoscale.
Surface and Microanalysis Science Division
Microanalysis Research Group
Ph.D., Physical Chemistry, Texas A&M University, College Station, Texas (2001). Course work in heterogeneous catalysis and surface science. Dissertation: Thermodynamic and Vibrational Studies of Model Catalyst Systems by Infrared Reflection Absorption Spectroscopy (Prof. D. W. Goodman)
B.A., Chemistry, Northwestern University, Evanston, Illinois (1996). Elective course work includes electromagnetic fields, advanced calculus, and economics.