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High resolution and high sensitivity analysis techniques aid nano material and device characterization.


The need for improved spatial resolution currently limits the ability of industry to answer key questions regarding the chemical composition of surfaces and interfaces. Needs range from improved chemical and structural diagnostics to phase identification and trace compositional analysis. In addition to meeting current industry needs in these areas, there is a continuing demand for new measurement methods to be developed that will be positioned to meet emerging measurement challenges.

Microanalysis Research Group maintains an active Nanotechnology program where atomic-resolution imaging and 3D tomographic techniques are applied to characterize nano-scale materials and features.

Start Date:

September 3, 2007

End Date:


Lead Organizational Unit: