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Significant improvements were made in the area of technique development for Eagle III mXRF since its initial installation in 2007. The diverse applications for mXRF-XSI include thin films, inks, paints and pigments, geological materials, cement and concrete, extraterrestrial meteorites, and the Smithsonian mineral standards. In these applications, mXRF-XSI has provided detailed information on composition, film thickness, trace element distribution, and homogeneity over large (centimeter) areas.
This research is primarily intended to benefit communities that perform X-ray mapping and X-ray spectrum imaging for compositional analysis of various samples. mXRF is capable of complementing and supplementing a host of analytical techniques including EPMA and QXRD. By expanding the user base of the mXRF, the impetus for software development and robust calibration methods will be established, thereby leading to further improvements to the technique.
In this project, our goal was to improve the speed, reliability and measurement accuracy in collecting grayscale and quantified X-ray spectrum images of large sample areas using mXRF. During the early phase of the project, many different types of samples were acquired from diverse groups and analyzed. Each new sample brought a variety of challenges and needs for new technique development. For instance:
Start Date:April 2, 2007
Lead Organizational Unit:mml
Eagle III mXRF