Surfaces and interfaces in multilayer thin films, metal/oxide heterostructures and interfaces, transition metal oxide surface science, reliability physics in nanomaterials and engineered nanostructures, in-situ transmission electron microscopy.
Microscopy Society of America (MSA)
NIST-ARRA Measurement Science and Engineering Fellowship, University of Colorado Boulder and National Institute of Standards and Technology (2011)
Outstanding Presentation, U.S. Department of Commerce Boulder Laboratories Annual Post-Doctoral Poster Symposium (2010, 2011)
PREP Postdoctoral Fellowship, University of Colorado Boulder and National Institute of Standards and Technology (2009-2011)
Top 10 Most Downloaded Articles of 2008, Transmission Electron Microscopy of Multilayer Thin Films, Annual Review of Materials Research (2008)
National Research Council (NRC) Postdoctoral Fellowship, U.S. Naval Research Lab (did not accept) (2005)
Best Oral Presentation, J.E. Hilliard Symposium, Department of Materials Science & Engineering, Northwestern University (2005)
Poster Award Winner, Fall Meeting of the Materials Research Society (2004)
BP Chemicals Graduate Student Award for Excellence in Environmental Molecular Science (2004)
Walter P. Murphy Graduate Fellowship, Northwestern University (2000)
Anvil Award for Outstanding Contributions to the Department of Materials Science and Engineering, University of Michigan (1999)
Foundry Educational Foundation Scholarship (1998)
Best Poster, Undergraduate Summer Institute, Laurence Livermore National Laboratory (1998)
Intel Foundation Women in Science and Engineering Scholarship, University of Michigan (1997-1999)
Clarence A. Siebert Memorial Scholarship, University of Michigan (1998)
James W. Freeman Memorial Scholarship, University of Michigan (1997)
Selected Publications:A. Sanders, P. Blanchard, K. Bertness, M. Brubaker, C. Dodson, T. Harvey, A. Herrero, D. Rourke, J. Schlager, N. Sanford, A.N. Chiaramonti, A. Davydov, A. Motayed, and D. Tsvetkov. Homoepitaxial n-core: p-shell gallium nitride nanowires: HVPE overgrowth on MBE nanowires.
Nanotechnology 22 (2011) 465703.
Y. Liu, A.N. Chiaramonti, D.K. Schreiber, H-S. Yang, S.S.P. Parkin, O.G. Heinonen, and A.K. Petford-Long. Effect of Annealing and Applied Bias on Barrier Shape in CoFe/MgO/CoFe Tunnel Junctions.
Physical Review B 83 (2011) 165413.
M.C. Strus, A.N. Chiaramonti, Y-L. Kim, Y.J. Jung, and R.R. Keller. Accelerated Reliability Testing of Highly Aligned Single-Walled Carbon Nanotube Networks Subjected to DC Electrical Stressing.
Nanotechnology 22 (2011) 265713.
Materials Reliability Division
Nanoscale Reliability Group
Related LinksNanoscale Reliability Group
2011-Present: NIST-ARRA Measurement Science and Engineering Fellow. University of Colorado Boulder Senior Research Associate & NIST Affiliate. Boulder, CO
2009-2011: PREP Post-Doctoral Fellow. University of Colorado Boulder Research Associate & NIST Affiliate. Boulder, CO
2005-2008: Post-Doctoral Research Associate. Interfacial Materials Group, Materials Science Division, Argonne National Laboratory. Argonne, IL
2000-2005: Graduate Research Associate. Department of Materials Science & Engineering, Northwestern University. Evanston, IL
2000: Process Engineer Co-Op. Thin Films/Diffusion Group, Intel Corporation. Ocotillo, AZ
1999: Process Engineer Intern. DUV Lithography Group, Intel Corporation. Aloha, OR
1997, 1998: Manufacturing Engineering Intern. General Motors Corporation. Warren, MI
1997-1999: Undergraduate Research Associate. Department of Materials Science & Engineering, University of Michigan. Ann Arbor, MI