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Manufacturing Metrology Programs & Projects

(showing 1 - 15 of 44)
Optical Methods for 3-D Nanostructure Metrology
Last Updated Date: 04/03/2014

We develop new approaches to optical microscopy and electromagnetic modeling to enable improved metrology of nanoscale structures with dimensions … more

Wide-area Monitoring and Control of Smart Grid
Last Updated Date: 01/24/2014

Without ubiquitous, accurate, and reliable real-time sensors, the electric grid will not have the resiliency, reliability, and capacity to manage … more

Advanced Metering in Smart Distribution Grids
Last Updated Date: 01/24/2014

Electricity meters today face unprecedented challenges, from distorted waveforms on the grid, bidirectional metering for renewables, and the use … more

Industrial Ethernet Network Performance (IENetP)
Last Updated Date: 01/08/2014

Develop metrics, tests, and tools to determine and report the network performance of industrial Ethernet devices in a standardized way.

Ceramic Phase Equilibrium Data
Last Updated Date: 10/24/2013

Advanced ceramics and inorganic materials are critically enabling elements in devices and systems across many technology sectors, such as … more

SI Length and Traceability
Last Updated Date: 08/01/2013

In total, the SI Length and Traceability project addresses some central aspects of three cornerstones of precision length measurements: … more

Thin Film Electronics
Last Updated Date: 07/01/2013

The Thin Film Electronics Project enables the commercialization of emerging and future semiconductor electronic device technologies, such as … more

Traceable Scanning Probe Nano-Characterization
Last Updated Date: 05/08/2013

Research and development of rigorously SI traceable nano-characterization instrumentation, measurements, and procedures to enable a fundamental … more

Advanced Dimensional Measurement Systems for Manufacturing
Last Updated Date: 05/03/2013

The discrete manufacturing industry is experiencing an increase in the variety of dimensional measuring systems available to inspect manufactured … more

Three-Dimensional Nanometer Metrology
Last Updated Date: 04/30/2013

Three-dimensional measurements of nanometer-scale structures are of increasing importance for nanoscience and nanomanufacturing, including the … more

Dimensional Measurement Services
Last Updated Date: 04/23/2013

The Dimensional Measurement Services Project within the Semiconductor & Dimensional Metrology Division (683) of the Physical Measurement … more

Optical Surface Metrology and Nano-Structured Optics
Last Updated Date: 04/19/2013

Aspheric surfaces are indispensable in high-performance optical systems. The ability to accurately manufacture these surfaces to the required … more

Atom-Based Dimensional Metrology
Last Updated Date: 04/19/2013

A primary goal of this project is to develop intrinsic calibration standards based on the crystalline lattice. The ultimate limit for nanoscale … more

Forensic Topography and Surface Metrology
Last Updated Date: 04/19/2013

Provide SI-traceable measurements and standards for ballistic and toolmark identification and surface texture and microform calibrations. Enable … more

CMOS Device and Reliability
Last Updated Date: 04/11/2013

The CMOS Device and Reliability Project will develop advanced metrology tools to enable high performance CMOS (Complementary Metal Oxide … more

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