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Manufacturing Metrology News

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New Chip Defect-finding Scheme Attracts Industry Leaders
Release Date: 05/27/2015

A diagram of a transistor showing where the signal enters and where it is collected in both charge pumping and the new frequency-modulated charge … more

NIST Contributes to IEC White Paper on Wireless Sensor Networks, IOT
Release Date: 05/06/2015

A new white paper by an international team surveys the role of wireless sensor networks in the evolution of the Internet of Things (IoT). The … more

Seeing 3D Shapes with SEM
Release Date: 04/27/2015

A three-dimensional reconstruction of chip features from measurements using the NIST model-library method. As microchip feature dimensions … more

'Standing Room Only’ for PML’s Hands-On Dimensional Metrology Workshop
Release Date: 04/22/2015

Workshop attendee using a Universal Length Measuring Machine. Earlier this month, PML’s Dimensional Metrology Group hosted a three-day hands-on … more

Restoration Begins on NIST's Million-Pound Deadweight Machine
Release Date: 01/27/2015

For the first time in half a century, NIST’s 4.45-million newton (equivalent to one million pounds-force) deadweight machine – the largest in the … more

NIST Team Honored for Work on Military Smartphone Apps, Security
Release Date: 09/03/2014

National Institute of Standards and Technology (NIST) researchers have earned a 2014 GCN Award for Information Technology Excellence * for … more

Nearly Everyone Uses Piezoelectrics. Be Nice to Know How They Work.
Release Date: 01/29/2014

Piezoelectrics—materials that can change mechanical stress to electricity and back again—are everywhere in modern life. Computer hard drives. Loud … more

NIST March Meeting Showcases Advanced Technologies to Help Manage the Nation's Infrastructure
Release Date: 01/29/2014

Tiny, self-powered sensors that can be embedded in bridge structures and networked wirelessly to continuously monitor the structure's health. … more

NIST Awards $7.4 Million in Grants for Additive Manufacturing Research
Release Date: 09/19/2013

The National Institute of Standards and Technology (NIST) today* announced the award of two grants totaling $7.4 million to fund research projects … more

LED Lifetime Measurements
Release Date: 08/15/2013

Yuqin Zong works on the test chamber within which 480 LEDs more

New NIST Nanoscale Indenter Takes Novel Approach to Measuring Surface Properties
Release Date: 07/23/2013

Researchers from the National Institute of Standards and Technology (NIST) and the University of North Carolina have demonstrated a new design for … more

Nanoelectronics Conference Will Focus on Semiconductor Industry's Future
Release Date: 03/05/2013

How the semiconductor industry can create the next generations of nanoscale computing technology will be one of the themes of the 2013 … more

Large Mass Calibration
Release Date: 03/05/2013

Paul Emanuel (left) and Kevin Chesnutwood carefully hoist a container off its floor mount atop the platform of the large-mass balance-beam scale. … more

NIST ‘Hybrid Metrology’ Method Could Improve Computer Chips
Release Date: 09/05/2012

A refined method developed at the National Institute of Standards and Technology (NIST) for measuring nanometer-sized objects may help computer … more

NIST Cooperative Agreement with University of Maryland Supports Research on 21st Century Smart Systems
Release Date: 10/13/2011

The National Institute of Standards and Technology (NIST) awarded today a $1 million cooperative agreement to the University of Maryland at … more

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