Nanoparticle Manipulation Metrology

The Nanoparticle Manipulation Metrology Project will develop an optical tweezers system for the trapping and manipulation of nanoparticles.

The Nanoparticle Manipulation Metrology Project will develop an optical tweezers system for the trapping and manipulation of nanoparticles.  This will make possible the accurate, controlled placement of nanoparticles at predefined locations on substrates.  This will facilitate the development of accurate particle placement standards for the calibration of optical inspection tools.  In addition, the simultaneous trapping of multiple particles in three dimensions and control of the orientation of non-symmetric nanoparticles will be demonstrated.  This instrument will serve as a testbed for viable assembly methods for nanomanufacturing.  Through the controlled placement of nanoparticles, NIST will fabricate an accurate, ordered-array, standard reference material (SRM) for nanoparticle detection and placement.