PED Mission and VisionWelcome to the Precision Engineering Division (PED), one of five divisions of the Manufacturing Engineering Lab at the National Institute of Standards and Technology (NIST). OverviewPED is providing the United States with the foundation for dimensional measurements ranging over 12 orders of magnitude (kilometers to nanometers). PED establishes both artifact and documentary standards through research, development, measurement services, and information dissemination. PED conducts research and development in precision-engineered length-metrology-intensive systems in instrumentation for both measurement and production. PED delivers to industry important length-related measurements, standards, and technology services that directly support U.S. manufacturing’s products and processes. These standards are measured by conventional and frameless coordinate measuring machines (CMM) using both contact and optical measuring probes, machines, and systems. Features of interest range in size from one kilometer (calibrated telecommunication cables) to meters (laser trackers) to nanometers (CD metrology instruments). The spectrum of metrology instrumentation includes optical, particle beam, mechanical, electrical, and quantum-mechanical phenomena, all referred to the International System of Units (SI) unit of length (modernized metric system), which is defined through the use of stabilized lasers and displacement interferometry. PED has developed three programs to best utilize the talents of its personnel and thus meet its mission with maximum effectiveness. These three programs are:
PED MissionThe mission of PED is to provide the foundation of dimensional measurement that meets the needs of the U.S. industrial and scientific communities by:
Also within the mission of PED is to provide dimensional metrology assistance to other federal government agencies in order to address problems and needs that leverage NIST expertise, facilities, and capabilities. The mission of PED reflects its responsibility to perform four core functions: Research, Development, Measurement Services, and Information Dissemination. Each core function includes a variety of processes which serve numerous customers, collectively identified as industrial and scientific communities, both public and private. PED values accuracy, responsiveness, objectivity, value, knowledge, expertise, state of the art, integrity, and honesty in the performance of this mission. PED VisionThe vision of PED is to conduct research and development in precision-engineered length-metrology-intensive systems in both measuring and production machines. PED delivers to industry important length-related measurements, standards, and technology services that supports U.S. manufacturing's products and processes. Features of interest range in size from multiple meters to sub-nanometer. These are measured by framed and frameless general special-purpose measuring probes, machines, and systems. The spectrum includes optical, mechanical, electrical, and quantum-mechanical phenomena using the first-principle of the Systeme Internationale (SI) unit of length (modernized metric system) by means of stabilized lasers and displacement interferometry. Large-Scale Coordinate Metrology Group (821.11)Supports the division's mission with a concentration on measurements of one meter or larger. For example, measurements are made by coordinate measuring machines and frameless coordinate length-metrology systems. These involve mechanical-probe, laser-ranging, theodolite, and related interferometric systems. Engineering Metrology Group (821.12)Supports the division's mission with a concentration on measurements of one millimeter to one meter. These measurements are often of complex shape, such as turbine blades, threaded fasteners, and gears. Measurements are made by general and special-purpose feature and coordinate measuring systems. Surface and Microform Metrology Group (821.13)Supports the division's mission with a concentration on measurements of one micrometer to one millimeter where surface roughness and microform are critical. Measurements are made by tunneling microscopes, mechanical profilometry, phase-measuring interferometry and related techniques. Nanoscale Metrology Group (821.14)Supports the division's mission with a concentration on measurements of one nanometer to one micrometer. Measurements are made by tunneling, atomic-force, electron, and visible- and ultraviolet-light microscopies. The group places special emphasis on satisfying the advanced needs of U.S. microelectronic manufacturing industries. |
 
Manufacturing Engineering Laboratory (MEL)
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