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NIST Home  >  MEL  >  Nanomanufacturing Programs/Projects in MEL

Nanomanufacturing Programs/Projects in MEL

Atom-Based Standards and Fabrication

Control Systems and Positioning for Nanoscale Measurements and Standards

High-Throughput Nanometrology with Scatterfield Microscopy

Measurement Science for Intelligent Manufacturing Robotics and Automation

Nanomanufacturing Metrology Program

Nanometer Scale Dimensional Metrology

Nanoparticle Manipulation Metrology

Nanorobotics and NEMS Measurement Science

Next-Generation Nanometrology Program

Wafer Level AFM Metrology for Critical Dimension Measurements

tinted colorized micrograph above is a scanning electron micrograph of tin spheres. The micrograph was obtained using a system developed by NIST and two industrial partners that substantially increases the detail provided in SEM images  

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301 948 5668 Facsimile

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Date created: March 12, 2009 | Last updated: May 6, 2009 Contact: Mel Webmaster