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NIST Home  >  MEL  >  Manufacturing Metrology  >  Optical Metrology Programs/Projects in Manufacturing Metrology Division

Optical Metrology Programs/Projects in Manufacturing Metrology Division

Comparison and Uncertainty Evaluation of Methods for Asphere Metrology

Measurement Methods and Services for Optical Reference Surfaces

Measuring Aspheric Optics using Binary Holograms

Measuring the Height Transfer Function of Phase-Shifting Interferometers

Metrology for Advanced Optics

Nano-Structured Optics for Measuring Spherical Surfaces with Large Radii

Wafer Flatness and Wafer Thickness Variation

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Date created: March 17, 2009 | Last updated: June 23, 2009 Contact: Mel Webmaster