S.H. Yang, H. Zhang and S.M. Hsu, "Correction of Random Surface Roughness on Colloidal Probes in Measuring Adhesion", Langmuir, 23, No.3 (2007) 1195-1202. S.H. Yang, H. Zhang, M. Nosonovsky and K.-H. Chung, "Effects of contact geometry on pull-off force measurements with a colloidal probe", Langmuir, 24, No.3 (2008) 743-748. S.H. Yang, H. Zhang, M. Nosonovsky and K.-H. Chung, "Nanoscale water capillary bridges under deeply negative pressure", Chemical Physics Letters, 451, Issue 1-3, (2008) 88-92. |
Position:
Guest Researcher
Intelligent Systems Division Systems Integration Group Employment History:1991 – 1998 Research Scientist, Materials Research Group, SAMSUNG 1994 – 1996 Joint research projects between SAMSUNG and Russian Academy of Science. 1996 – 2002 Student Researcher, Korea Institute of Science and Technology (KIST). 2002 – 2003 Post Doctorial Research Fellow, KIST 2003 – 2007 Guest Researcher, Nanomechanical Properties Group, MSEL, National Institute of Standards and Technology (NIST) 2007 – present Research Associate, Intelligent Systems Div., National Institute of Standards and Technology (NIST) Education:Ph.D, Mechanical Engineering, Yonsei University (2002), South Korea Master of Science, Mechanical Engineering, Yonsei University (1998), South Korea Bachelor of Science, Metallurgical Engineering, Yonsei University (1988), South Korea
Phone: 301-975-8081 |