Materials Science Advanced Materials Programs and Projects | |
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Microsystems for Harsh Environment Testing
Last Updated Date: 11/13/2012 Our goal is to develop and demonstrate a MEMS-based methodology for evaluating time-dependent mechanical properties of materials that undergo … more
Nanotube Quality Control
Last Updated Date: 11/13/2012 Our goal is to develop new methods to rapidly screen bulk carbon nanotubes for chemical purity and homogeneity. The different synthesis routes … more
Fundamental Chemical Metrology
Last Updated Date: 10/22/2012 The Chemical Sciences Division serves as the Nation’s reference laboratory for chemical compositional measurements and standards to … more
Diffraction Metrology and Standards
Last Updated Date: 10/09/2012 Our objective is the development of Standard Reference Materials (SRMs) and quantitative, reproducible, and accurate measurement methods for … more
Nanostructure Fabrication Processes
Last Updated Date: 10/05/2012 In this project we are developing in situ measurements relevant to the electrochemical fabrication, processing, and application of nanostructured … more
Semiconductor Nanowire Metrology: Electronics, Photonics, and Sensors
Last Updated Date: 10/05/2012 In this project, we are developing metrology needed for the synthesis, processing, and characterization of semiconductor nanowire structures to … more
Magnetic Nanostructures for post-CMOS Electronics
Last Updated Date: 10/05/2012 Our goal is to address the metrology of magnetic effects at the nanoscale level. Nanomagnet arrays form the basis for major data storage … more
Synchrotron Beamline Operations
Last Updated Date: 10/04/2012 Our objective is to ensure that the NIST beamlines U7A, X23A2, and X24A, located at the National Synchrotron Light Source (NSLS) at Brookhaven … more
Measurement and Prediction of Local Structure
Last Updated Date: 10/04/2012 Our goal is to provide analytical tools that allow measurement and prediction of local structure to enable the development of ceramic materials … more
Synchrotron X-ray Measurements
Last Updated Date: 10/04/2012 Our objective is to provide comprehensive descriptions of the structure of advanced materials and devices by performing synchrotron-based … more
Synchrotron X-ray Measurement Method Development
Last Updated Date: 10/04/2012 Our goal is to develop state of-the-art synchrotron X-ray measurement technology, including instrumentation, methods, and analytical tools, to … more
Chemical/Biochemical Microsensor Science
Last Updated Date: 10/02/2012 The Process Sensing Group at NIST is investigating a range of fundamental and technological issues related to next-generation chemical and … more
Coupling Nanowire Chemisresistors with MEMS Microhotplate Gas Sensing Platforms
Last Updated Date: 10/02/2012 Recent advances in nanotechnology have yielded materials and structures that offer great potential for improving the sensitivity, selectivity, … more
Nanoparticle Assembly
Last Updated Date: 10/02/2012 Our goal is to develop a platform for in situ measurements of the directed assembly of complex solutions of nanoscale building blocks (NBB)s into … more
Determinations of Boron Deposit Quality by Neutron Depth Profiling
Last Updated Date: 10/01/2012 Straw detectors are a new concept in position-sensitive neutron detectors recently developed by Proportion Technology Inc. The detectors are … more |
Contact
General Information:301-975-NIST (6478) inquiries@nist.gov 100 Bureau Drive, Stop 1070 Gaithersburg, MD 20899-1070 |