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Materials Science Advanced Materials News

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Getting the Point: Real-Time Monitoring of Atomic-Microscope Probes Adjusts for Wear
Release Date: 03/30/2011

Scientists at the National Institute of Standards and Technology (NIST) have developed a way to measure the wear and degradation of the … more

Real-World Graphene Devices May Have a Bumpy Ride
Release Date: 01/19/2011

Electronics researchers love graphene. A two-dimensional sheet of carbon one atom thick, graphene is like a superhighway for electrons, which … more

Quartz Crystal Microbalances Enable New Microscale Analytic Technique
Release Date: 11/24/2010

A new chemical analysis technique developed by a research group at the National Institute of Standards and Technology (NIST) uses the shifting … more

Depth Charge: Using Atomic Force Microscopy to Study Subsurface Structures
Release Date: 06/23/2010

Over the past couple of decades, atomic force microscopy (AFM) has emerged as a powerful tool for imaging surfaces at astonishing … more

2010 TIP Competition Focuses on Manufacturing Technologies
Release Date: 04/15/2010

The U.S. Commerce Department's National Institute of Standards and Technology (NIST) today announced a new competition for high-risk, high-reward … more

Showcase - Focus on Microfluidics
Release Date: 10/12/2007

A TECHNOLOGY TRANSFER AND FEDERAL MARKETPLACE EVENT NIST Presents Its Microfluidics Technologies For Commercial Adoption On Tuesday, October 9, … more

Mass Spectrometry Methods Database Gets Major Update
Release Date: 05/25/2006

Researchers at the National Institute of Standards and Technology (NIST) recently added 150 new methods—nicknamed "recipes"—to a database already … more

NIST Testing Method Quickly Tells Whether Thin Films Are Strong Enough for the Job
Release Date: 07/12/2004

The challenge of determining whether thin films—some no thicker than a single molecule—are strong enough for a growing number of important … more

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