Materials Science Advanced Materials News | |
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Graphene: What Can Go Wrong? New Studies Point to Wrinkles, Process Contaminants
Release Date: 07/06/2011 Using a combination of sophisticated computer modeling and advanced materials analysis techniques at synchrotron laboratories, a research team led … more
John Cahn to Receive 2011 Kyoto Prize for Fundamental Contributions to Materials Science
Release Date: 07/06/2011 John Cahn, an emeritus senior fellow and materials scientist at the U.S. Commerce Department’s National Institute of Standards and … more
John Cahn to Receive 2011 Kyoto Prize For Fundamental Contributions to Materials Science
Release Date: 06/24/2011 John Cahn, an emeritus senior fellow and materials scientist at the U.S. Commerce Department’s National Institute of Standards and … more
NIST Workshop Highlights Planned Consortium for Soft Material Manufacturing Research
Release Date: 05/18/2011 The National Institute of Standards and Technology (NIST) is holding a special industry workshop on June 2 and 3, 2011, at the NIST laboratories … more
Understanding How Glasses 'Relax' Provides Some Relief for Manufacturers
Release Date: 04/26/2011 Researchers at the National Institute of Standards and Technology (NIST) and Wesleyan University have used computer simulations to gain basic … more
Getting the Point: Real-Time Monitoring of Atomic-Microscope Probes Adjusts for Wear
Release Date: 03/30/2011 Scientists at the National Institute of Standards and Technology (NIST) have developed a way to measure the wear and degradation of the … more
Real-World Graphene Devices May Have a Bumpy Ride
Release Date: 01/19/2011 Electronics researchers love graphene. A two-dimensional sheet of carbon one atom thick, graphene is like a superhighway for electrons, which … more
Quartz Crystal Microbalances Enable New Microscale Analytic Technique
Release Date: 11/24/2010 A new chemical analysis technique developed by a research group at the National Institute of Standards and Technology (NIST) uses the shifting … more
Depth Charge: Using Atomic Force Microscopy to Study Subsurface Structures
Release Date: 06/23/2010 Over the past couple of decades, atomic force microscopy (AFM) has emerged as a powerful tool for imaging surfaces at astonishing … more
2010 TIP Competition Focuses on Manufacturing Technologies
Release Date: 04/15/2010 The U.S. Commerce Department's National Institute of Standards and Technology (NIST) today announced a new competition for high-risk, high-reward … more
Showcase - Focus on Microfluidics
Release Date: 10/12/2007 A TECHNOLOGY TRANSFER AND FEDERAL MARKETPLACE EVENT NIST Presents Its Microfluidics Technologies For Commercial Adoption On Tuesday, October 9, … more
Mass Spectrometry Methods Database Gets Major Update
Release Date: 05/25/2006 Researchers at the National Institute of Standards and Technology (NIST) recently added 150 new methods—nicknamed … more
NIST Testing Method Quickly Tells Whether Thin Films Are Strong Enough for the Job
Release Date: 07/12/2004 The challenge of determining whether thin films—some no thicker than a single molecule—are strong enough for a growing number … more |
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